Electron Shuttle Characteristics of the Micrometer-Sized Floating Electromechanical Devices

Chen Peng,Sun Jiandong,Qin Hua,Gu Xiaofeng
DOI: https://doi.org/10.3969/j.issn.1671-4776.2013.04.002
2013-01-01
Abstract:As a model device used to further study nanometer-sized electron shuttle devices,the electron shuttle characteristics of the micrometer-sized metallic beads were studied.The beads were confined between two electrodes and can move to-and-fro freely.The current-voltage cha-racteristics predicted by classic model were verified through measuring the shuttle current under the different voltages.By monitoring the real-time electron shuttle signal pulse,the electron shuttle current predicted by classic model and the induction current unpredicted by classic model in the system were verified.Through an electric field simulation of the electrode-microsphere-electrode structure,the physical origin of the induction current was revealed.It is revealed that the dynamic capacitance change is generated during the collision of electrode and microsphere,and hence an instantaneous induction current is induced.By measuring the shuttle current and the shuttle frequency under the different voltages,the classic shuttle model was modified,and the charge correction factor induced by the induction current was provided.
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