Abstract:The surface potential distribution measured using Kelvin probe force microscopy (KPFM) is influenced by the contact potential difference (CPD) between the tip and surface, the stray capacitance of the cantilever, and fixed monopole charges on the surface and tip. The interpretation of atomic-scale KPFM contrast studies has been controversial. Here, we investigate the contrast mechanism in KPFM with atomic resolution. First, the effect of stray capacitance on potential measurements is explored in the FM-, AM-, and heterodyne AM-KPFM modes. The distance dependence of the modulated electrostatic force in AM-KPFM is much weaker than that in FM-and heterodyne AM-KPFM, and the stray capacitance of the cantilever, which strongly affects potential measurements in AM-KPFM, is almost completely eliminated in FM-and heterodyne AM-KPFM. The very small local contact potential difference (LCPD) corrugation in AM-KPFM is attributed to an artefact induced by the topographic feedback. Next, an investigation of the LCPD on a TiO2 (110)-1 x 1 surface and atom-dependent bias-distance spectroscopic mapping are performed. The LCPD of TiO2 (110) is dominated not only by the permanent surface dipole between the tip apex atom and the surface, but also by the dipoles induced by the chemical interaction between the tip and sample. Finally, we propose a new multiple-image method for obtaining the frequency shift, tunneling current, and LCPD images. For the first time, we obtain three images on a TiO2(110) surface with atomic resolution at 78 K. The LCPD has a higher value on a defect site than on the nearby O rows because excess electrons caused by surface defects are delocalized on the nearby Ti rows. The multiple-image method can be used to investigate the charge transfer phenomena between nanoparticles and surface sites and to elucidate the mechanisms of catalytic reactions.

Probing The Microelastic Properties Of Nanobiological Particles With Tapping Mode Atomic Force Microscopy

Probing the organization of photosystem II in photosynthetic membranes by atomic force microscopy.

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Nanoscale Mechanical Manipulation of Ultrathin SiN Membranes Enabling Infrared Near‐Field Microscopy of Liquid‐Immersed samples

Probing Local Cellular Mechanics by Atomic Force Microscopy with Modified Spherical Tip

Nanoscale mechanical manipulation of ultrathin SiN membranes enabling infrared near-field microscopy of liquid-immersed samples

Probing the Nanonewton Mitotic Cell Deformation Force by Ion-Resonance-Enhanced Photonics Force Microscopy

Nanomechanical and topographical imaging of living cells by atomic force microscopy with colloidal probes

Investigating The Organization Of Photosystem Ii In Spinach Photosynthetic Membranes By Atomic Force Microscopy

Single-Walled Carbon Nanotube AFM Probes: Optimal Imaging Resolution of Nanoclusters and Biomolecules in Ambient and Fluid Environments

Probing Nanometer Structures with Atomic Force Microscopy

Kelvin Probe Force Microscopy with Atomic Resolution

Investigation of Near-Surface Mechanical Properties of Materials Using Atomic Force Microscopy

Microfabricated double-tilt apparatus for transmission electron microscope imaging of atomic force microscope probe

Conditions to minimize soft single biomolecule deformation when imaging with atomic force microscopy

Simultaneous Nanomechanical and Electrochemical Mapping: Combining Peak Force Tapping Atomic Force Microscopy with Scanning Electrochemical Microscopy

Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy

Structural and functional imaging with carbon nanotube AFM probes

Amplitude Response of Multiwalled Carbon Nanotube Probe with Controlled Length During Tapping Mode Atomic Force Microscopy

Probing membrane proteins using atomic force microscopy.

Application of Some Atomic Force Microscopic Imaging Mode in Observation of Polymer Solar Cells