On-Line Thickness Measurement System for Calender Based on Virtual Instrument

GUO Li-feng,FAN Yu-ming,ZHANG Jia-liang,ZHANG Chao,ZHANG Guo-xiong
DOI: https://doi.org/10.3969/j.issn.0493-2137.2007.10.021
2007-01-01
Abstract:An on-line thickness measurement system for calender based on virtual instrument was proposed.In this system,an optical projection method based on linear CCD is used to realize the on-line thickness measurement for sheet product.Based on C8051 microcontroller,the integrated sensor module and 2-D coordinate data acquisition module were developed to record the values of thickness and position coordinates.A personal computer(PC)-based data acquisition and control system was established by using LabVIEW,a powerful development environment for virtual instrument.The USB and RS485 serial bus were used to connect the PC and measuring modules.The control of thickness measurement system and data analysis can be performed through the virtual instrument interface on PC screen.The in situ experiments show that the on-line measurement standard deviation is 20 μm within the measuring range of 10 mm.The measuring system can realize the on-line thickness measurement efficiently and accurately.
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