Abstract:Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to the appearance of the defect symptom (e.g., when buggy program elements are being committed to a version control system). We refer to this type of defect localization as “Just-In-Time (JIT) Defect localization”. Although many prior studies have proposed various JIT defect identification methods to identify whether a new change is buggy, these prior methods do not locate the suspicious positions. Thus, JIT defect localization is the next step of JIT defect identification (i.e., after a buggy change is identified, suspicious source code lines are located). To address this problem, we propose a two-phase framework, i.e., JIT defect identification and JIT defect localization. Given a new change, JIT defect identification will identify it as buggy change or clean change first. If a new change is identified as buggy, JIT defect localization will rank the source code lines introduced by the new change according to their suspiciousness scores. The source code lines ranked at the top of the list are estimated as the defect location. For JIT defect identification phase, we use 14 change-level features to build a classifier by following existing approach. For JIT defect localization phase, we propose a JIT defect localization approach that leverages software naturalness with the N-gram model. To evaluate the proposed framework, we conduct an empirical study on 14 open source projects with a total of 177,250 changes. The results show that software naturalness is effective for our JIT defect localization. Our model achieves a reasonable performance, and outperforms the two baselines (i.e., random guess and a static bug finder (i.e., PMD)) by a substantial margin in terms of four ranking measures.

MDCI: Hardware Fault Localization Based on Multi-Granularity Dynamic Control Flow Invariants

A Dynamic Fault Localization Technique with Noise Reduction for Java Programs

Hardware-Assisted Control-Flow Integrity Enhancement for IoT Devices

Adaptive Call-Site Sensitive Control Flow Integrity

Just-In-Time Defect Identification and Localization: A Two-Phase Framework.

Multivariate image analysis in gaussian multi-scale space for defect detection

A General Noise-Reduction Framework for Fault Localization of Java Programs.

Improved Threshold for the Local Approach in Detecting Faults

Defect Localization in Flip-Chip Devices Using Space-Domain Reflectometry and Magnetic Current Imaging

Open-Circuit Fault Diagnosis for MMC Based on Event-Triggered and Capacitor Current State Observation.

Latent and Small Fault Detection and Diagnosis for Dynamic Processes

Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects

CFaults: Model-Based Diagnosis for Fault Localization in C Programs with Multiple Test Cases

CoMID: Context-Based Multiinvariant Detection for Monitoring Cyber-Physical Software

Track Down HW Function Faults Using Real SW Invariants

Dynamic Error Detection for Dependable Cache Coherency in Multicore Architectures

A Voltage-Based Open-Circuit Fault Detection and Isolation Approach for Modular Multilevel Converters With Model-Predictive Control

A Source-Level Instrumentation Framework for the Dynamic Analysis of Memory Safety

Fault Localization of Cnc Software Based on Searching in Divided Execution Trace

A complex-valued slow independent component analysis based incipient fault detection and diagnosis method with applications to wastewater treatment processes

A Fault-Localization Approach Based on the Coincidental Correctness Probability