Abstract:In this study, we develop a digital integrated circuit testing model (DITM) based on a statistical simulation method to evaluate the test quality and yield of integrated circuit products. This model can be used to quantify the characteristics of the device under test (DUT) and simulate the effect of the test guardband (TGB) on test results during testing. The complexity and functionality of integrated circuits have continued to increase over the past two decades. Moreover, the development in speed of automated test equipment (ATE), e.g., OTA or overall timing accuracy, according to the ITRS report, lags behind the progress of semiconductor manufacturing. Hence, using existing instruments and tools to select zero-defect products would be a considerable challenge for suppliers due to the slow development of the testing technology. We propose a new scheme of using multiple retest systems (MRSs) to improve the yield while maintaining the desired quality to address the product quality requirements of consumers. We also use a set of parameters from IRDS 2021 (International Roadmap for Devices and Systems 2021) to estimate the future test yield (Y t ) and test quality through DITM calculations. MRS results showed that the test yield (Y t ) can be improved while achieving the expected quality. MRSs not only improve the performance of the tester but also demonstrate effective performance in the yield improvement of high-quality products. This approach enables high-quality, high-yield chip delivery, and significantly increases the overall profit of the company.

A Test Model of Integrated Circuit Manufacture Equipment for Automatic Test System

A General Automatic Test System for Instruments in IC Equipment

Research and Implementation of CIMS Architecture for PCB Manufacturing

Modelling and Computation of Equipment Reliability for Manufacturing System Based on Petri Net

Testability modeling of complicated electronic equipments facing to life cycle

Evaluation Model & Knowledge-Base of PCB DFM

Study of Modeling of Built-in-self-test Technology for board-level circuit

Graphical Hybrid Diagnostic Model-Based Software Architecture for System Testability Analysis

Model Driven Automated Testing for IMA Standard Compliance

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

Modeling, Qualitative Analysis, and Performance Evaluation of the Etching Area in an Ic Wafer Fabrication System Using Petri Nets

Research on Modeling Techniques of Testability Evaluation Based on Modelica

A flexible card configuration system for instrument testing in wafer fabrication equipment

A LabVIEW Based Automatic Test System for Sieving Chips

System Testability Analysis for Complex Electronic Devices Based on Multisignal Model

Researching on method of modeling complex electronic system for testability

Power Equipment Diagnosis and Management System Model Based on CIM

Multiple Retest Systems for Screening High-Quality Chips

A Hierarchical Modeling and Fault Diagnosis Technique for Complex Electronic Devices

Research on Engineering Testing Model of Mechatronics Products

Indirect Testing of Specifications in Analog Integrated Circuits Based on Black-Box Modeling