Classification of Short Circuit Faults Causing Voltage Sags Based on Double dq Transformation

Xiong Du,Luowei Zhou,XU Kefu
2010-01-01
Abstract:Voltage sags caused by short circuit fault are one of the most severe power quality events.It is beneficial to the operation and management of a power system if the short circuit fault types can be identified.A short circuit fault classification method based on double dq transformation is proposed in this paper.The proposed method decomposes the measured three-phase voltage to positive and negative sequences first,and then transforms the two-sequence components into dq frames.Phase angle and root-mean-square value of the voltage are generated as characteristic values to identify the fault types.This method only requires a few logic and simple algebraic calculation,and also can be combined with voltage sag detection to form a unified voltage sag detection and fault classification method.
What problem does this paper attempt to address?