Reliability Modeling and Management of Nanophotonic On-Chip Networks

Zheng Li,Moustafa Mohamed,Xi Chen,Eric Dudley,Ke Meng,Li Shang,Alan R. Mickelson,Russ Joseph,Manish Vachharajani,Brian Schwartz,Yihe Sun
DOI: https://doi.org/10.1109/TVLSI.2010.2089072
2012-01-01
Abstract:AbstractWhile transistor performance and energy efficiency have dramatically improved in recent years, electrical interconnect improvements has failed to keep pace. Recent advances in nanophotonic fabrication have made on-chip optics an attractive alternative. However, system integration challenges remain. In particular, the parameters of on-chip nanophotonic structures are sensitive to fabrication-induced process variation and run-time spatial thermal variation across the die. This work addresses the performance and reliability challenges that arise from this sensitivity to variation. The paper first presents a model predicting the system-level effects of thermal and process variation in nanophotonic networks. It then shows how to optimize many-core system performance and reliability by using run-time techniques to compensate for the thermal and process variation effects.
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