Abstract:With the emergence of deep sub-micron technology, the reliability issues in on-chip interconnect has enormously increased. This includes single event upsets, like soft errors, and hard faults which are rapidly becoming important factors to be considered. Aggressive technology scaling renders these architectures vulnerable to system performance, intermittent failure, capacitive crosstalk, and power dissipation problem. To improve the performance of the area and power consumption along with bandwidth, throughput and latency, a Buffer Potency Power Gating Technique is carried out to predict the Intermittent Failure by Presage Debacle Model in Network on Chip. In the Presage Debacle Model, the links present in the application-specific topology are provided with real application traffic to assist in prediction of the intermittent failure. By predicting the failure, the output of the model provides the power dissipated over the connection of the application link. Then the crosstalk noise in the topology is reduced by the Adaption of Simulated Annealing (SA) based Particle Swarm Optimization (PSO) congruence algorithm. The optimization congruence algorithm assigns each task in the application software to each node in the topology to determine the network's optimal output. It continuously changes the task park position in the topology system and reduces the crosstalk of the NoC. Consecutively, the area and power consumption are minimized by Buffer Potency Power Gating Technique. Buffer efficiency is increased and the power-gating is a practical way to mitigate NoC power control schemes properly and effectively without any loss in performance. Thus the prediction of intermittent failure is obtained by utilizing NoC to improve the performance of area and power consumption.

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Hybrid Performance Modeling And Analyzing Of Parallel Systems

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Improving Multi-Core System Dependability with Asymmetrically Reliable Cores

Reliability Modeling and Management of Nanophotonic On-Chip Networks

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Reliability Assessment and Quantitative Evaluation of Soft-Error Resilient 3D Network-on-Chip Systems

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Device Modeling and System Simulation of Nanophotonic On-Chip Networks for Reliability, Power and Performance

A Survey of fault models and fault tolerance methods for 2D bus-based multi-core systems and TSV based 3D NOC many-core systems

System-level reliability modeling for MPSoCs.

A dynamic delay-based reliability evaluation model for communication networks

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Combinatorial Reliability Analysis of Multicore Processors