A New Neural Network Approach to Electronic Circuit Fault Diagnosis

Wen Jie Tian,Yu Geng
DOI: https://doi.org/10.1109/ETCS.2009.318
2009-01-01
Abstract:To overcome the deficiencies of single neural network such as low diagnosis precision, long training time and bad generalized ability, an integrated neural network classifier is proposed for electronic circuit fault diagnosis in the paper. The investigation shows that the proposed method has higher classification precision and reliability, and is an ideal pattern classifier. Both simulation and experiment indicate that the proposed method is quite effective and ubiquitous.
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