Pressure dependent thermoreflectance spectroscopy induced by interband transitions in metallic nano-film

Zhongyin Zhang,Zheng Chang,Xuanhui Fan,Jing Zhou,Xinwei Wang,Gen Li,Xiaoliang Zhang,Jie Zhu,Dawei Tang
DOI: https://doi.org/10.1016/j.isci.2021.102990
IF: 5.8
2021-09-01
iScience
Abstract:Utilizing high-pressure to modulate optical properties, such as thermoreflectance (<i>dR/dT</i>), over a wide range has received much attention. Nevertheless, how the pressure exerts on the complex dielectric constant and finally on <i>dR/dT</i> remains elusive. Here, we perform a thoroughly experimental and theoretical investigation on <i>dR/dT</i> of Al nano-film from 0 to 25 GPa. The <i>dR/dT</i> values exhibit a sine-like pressure-dependence, with the zero-crossing appearing at around 6 GPa. These special phenomena are well explained from electron transition viewpoints. The <i>first-principles</i> calculations show that the energy difference of parallel bands is enlarged from 1.45 to 2 eV, thereby increasing the threshold for electron transitions. The lifted threshold changes the optical absorption rates of Al and the density of states of the electrons involving interband transitions; finally, the resulting <i>dR/dT</i> exhibits such a pressure-dependent behavior. Our findings provide a deep insight on pressure-induced electronic transitions and photon-electron interactions in metals.
multidisciplinary sciences
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