Abstract:The recently emerging digital image correlation (DIC)-assisted fringe projection profilometry (FPP) has been demonstrated to be superior in shape and deformation measurement on complex structures. But the contradictory demands on the reflectivity of tested surface between FPP and DIC extremely limit its measuring accuracy. In this work, chromatic DIC-assisted FPP is proposed to achieve accurate 3-D shape, deformation measurement, and strain analysis. First, colorful fluorescent pigment is introduced to fabricate speckle patterns, and the optimal fluorescent color is solved to simultaneously ensure high fringes intensity modulation and speckles’ chroma difference; then, the intensity-chroma space analysis method is presented to modulate and demodulate the projected fringe and fabricated speckle information in intensity and chroma space without interference. High-quality fringe and speckle patterns can be simultaneously obtained for accurate shape, deformation, and strain measurement. To the best of our knowledge, for the first time, it essentially overcomes inherent contradictions between FPP and DIC on the requirement of surface reflectivity. Finally, the chain rule is introduced to further complete strain analysis with less computational cost. Experimental results demonstrated that the proposed method could simultaneously guarantee shape and deformation measurement accuracy. Meanwhile, both complete and fine surface geometry and its strain distributions can be obtained with simple convolution and algebraic operations, which can provide an alternative method for bridging 3-D geometric structures and the mechanical state of complex specimens.

Chromatic focus variation microscopy for surface metrology

Chromatic Aberration Correction Based on Cross-Channel Information Alignment in Microscopy

Fiber-based Chromatic Confocal Microscope with Gaussian Fitting Method

Advances of Confocal Microscopy in Three-Dimensional Surface Topography Measurement

Surface Form Metrology of Micro-Optics

Research on Microscopic 3D Measurement System Based on Focus Variation

Surface Profile Measurement Using Chromatic Confocal Microscopy

Chromatic Confocal Sensor-Based Sub-Aperture Scanning and Stitching for the Measurement of Microstructured Optical Surfaces.

Parameter selection on a multi-exposure fusion method for measuring surfaces with varying reflectivity in microscope fringe projection profilometry

Fiber-coupled Chromatic Confocal 3D Measurement System and Comparative Study of Spectral Data Processing Algorithms

Innovative full-field chromatic confocal microscopy using multispectral sensors

Some Considerations about the Use of Contact and Confocal Microscopy Methods in Surface Texture Measurement

The Use of Focus-Variation Microscopy for the Assessment of Active Surfaces of a New Generation of Coated Abrasive Tools

Extracting Focus Variation Data from Coherence Scanning Interferometric Measurements

A Simple Optical Fiber-coupled Chromatic Confocal 3D Measurement System

Development of novel one-shot full-field surface profilometer using chromatic confocal microscopy

On-machine focus variation measurement for micro-scale hybrid surface texture machining

3-D optical microscopy with a new synthetic SFF algorithm to reconstruct surfaces with various specular and diffusive reflectance

Optical and Electromechanical Design and Implementation of an Advanced Multispectral Device to Capture Material Appearance

Chromatic DIC-Assisted Fringe Projection Profilometry for Shape, Deformation, and Strain Measurement With Intensity-Chroma Space Analysis

Chromatic Confocal Measurement Method Using a Phase Fresnel Zone Plate.