Abstract:Specific emitter identification (SEI) is a highly potential technology for physical layer authentication that is one of the most critical supplement for the upper-layer authentication. SEI is based on radio frequency (RF) features from circuit difference, rather than cryptography. These features are inherent characteristic of hardware circuits, which difficult to counterfeit. Recently, various deep learning (DL)-based conventional SEI methods have been proposed, and achieved advanced performances. However, these methods are proposed for close-set scenarios with massive RF signal samples for training, and they generally have poor performance under the condition of limited training samples. Thus, we focus on few-shot SEI (FS-SEI) for aircraft identification via automatic dependent surveillance-broadcast (ADS-B) signals, and a novel FS-SEI method is proposed, based on deep metric ensemble learning (DMEL). Specifically, the proposed method consists of feature embedding and classification. The former is based on metric learning with complex-valued convolutional neural network (CVCNN) for extracting discriminative features with compact intra-category distance and separable inter-category distance, while the latter is realized by an ensemble classifier. Simulation results show that if the number of samples per category is more than 5, the average accuracy of our proposed method is higher than 98\%. Moreover, feature visualization demonstrates the advantages of our proposed method in both discriminability and generalization. The codes of this paper can be downloaded from GitHub(<a class="link-external link-https" href="https://github.com/BeechburgPieStar/Few-Shot-Specific-Emitter-Identification-via-Deep-Metric-Ensemble-Learning" rel="external noopener nofollow">this https URL</a>)

Few-Shot Specific Emitter Identification Using Asymmetric Masked Auto-Encoder

Few-Shot Specific Emitter Identification via Deep Metric Ensemble Learning

Few-Shot Specific Emitter Identification via Hybrid Data Augmentation and Deep Metric Learning

Fast Fourier Transform with Multihead Attention for Specific Emitter Identification

Few-Shot Metric Learning with Time-Frequency Fusion for Specific Emitter Identification

Resource-Constrained Specific Emitter Identification Using End-to-End Sparse Feature Selection

Enhancing Specific Emitter Identification Performance in Limited Sample Scenarios under Digital Pre-Distortion

Enhanced Specific Emitter Identification With Limited Data Through Dual Implicit Regularization

Semi-Supervised Specific Emitter Identification Via Dual Consistency Regularization

Few-Shot Domain Adaption-Based Specific Emitter Identification under Varying Modulation

Squeeze Excitation Densely Connected Residual Convolutional Networks for Specific Emitter Identification Based on Measured Signals

A Specific Emitter Identification Method Based on Self-Supervised Representation Learning

Specific Emitter Identification Based on Multi-Domain Features Learning

Specific Emitter Identification Model Based on Improved BYOL Self-Supervised Learning

Specific Emitter Identification of Frequency Hopping Signals Based on Feature Extraction and Deep Residual Network

A Self-Supervised-Based Approach of Specific Emitter Identification for the Automatic Identification System

Specific Emitter Identification Based on Software-Defined Radio and Decision Fusion

LT-SEI: Long-Tailed Specific Emitter Identification Based on Decoupled Representation Learning in Low-Resource Scenarios

Specific emitter identification based on multiple sequence feature learning

Specific Emitter Identification Using IMF-DNA with a Joint Feature Selection Algorithm

Enhancing RF Fingerprinting with a Simulated Attack Detection Strategy for Few Labeled Signals