New Applications for Pulsed/Isothermal Test System

Jonathan B. Scott,A. Parker,J. Rathmell,M. Sayed
DOI: https://doi.org/10.1109/ARFTG.1996.327166
1996-06-01
Abstract:An Arbitrary Pulsed Semiconductor Parameter Analyser (APSPA) system, developed originally for isothermal, high-power characterisation, is described. Assembled from off-the-shelf modules, the system boasts rapid and precise measurement, making it appealing for production-line use. Several novel measurements with application in research, modelling, and testing environments, are presented.
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