Bifactor Modelling, Reliability, and Validity of the Material Values Scale in Chinese Youth

Jing Wang,Xiaoyang Xin,Yongquan Huo,Ying Li,Yue Han,Feng Kong
DOI: https://doi.org/10.1177/00332941221114407
Abstract:The present study validated the bifactor model of the Material Values Scale (MVS) and examined the association between materialism and subjective well-being (SWB). Study 1 utilized a material values questionnaire that 1673 college students completed. Confirmatory factor analysis results indicated that the bifactor model of the MVS had a better fit than other models. Likewise, the findings were replicated in Study 2 using a larger sample size (N = 2627). Through structural equation modeling, only the general and specific factors of success were found to be negative predictors of SWB. Our study both provides a methodological reference for measuring the MVS and compensates for the limitations of MVS measurement results.
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