Abstract:An in-situ measurement system for porous alumina (PA) film based on atomic force microscope (AFM) in liquid and reflectometric interference spectroscopy (RIFS) was developed. The present article briefly discusses the principle and structure of the system, and introduces its unique characteristic. The system consists of probe unit, XY scanner, Z-piezo feedback system, computer and software, fiber optic spectrometer, anodization control circuitry etc. When a white light beam illuminates the surface of the film, the reflective light beams at the front and back side of the layer are coherent, and lead to periodical amplifications and extinction in the reflective spectrum with the information of the optical thickness of the film. A fiber optic spectrometer was applied in the system which input the refractive spectrum into the computer by which the optical thickness of the film was calculated. Meanwhile according to the surface topography of PA films by AFM in liquid, the effective refractive index was calculated based on Maxwell-Garnett theory and coherent potential approximation (CPA). So the thickness of PA films could be gained at last. To checkout the feasibility and stability of the system, the real-time scanning and thickness measurement experiments were done during anodization of Al sheets in oxalic acid aqueous solution. In the experiment, the authors used 25 mm diameter aluminum (Al) sheets with 99.999% purity and 0.4 mm thickness as the anode, and graphite rod as the cathode. The pretreatment-cleaned Al sheets were anodized in an aqueous solution of 0.5 mol x L(-1) oxalic acid at the constant temperature (20 +/- 0.2) degrees C with 20 mA x cm(-2) anodization electronic current density. Real-time AFM images of PA film were successfully obtained during anodization. The pore-ratios of Al sheet were 7.81% and 13.83% at oxidizing time 150 min and 180 min respectively. Correspondingly, the effective indexes were calculated to be 1.62 and 1.60, respectively. Combining the reflective spectrum gained by the fiber optic spectrometer, the wave number differences between the two adjacent extrema were 57.69 mm(-1) and 50.00 mm(-1). Based on reflectometric interference spectroscopy, the thickness of PA films was found to be 5.35 and 6.25 microm with oxidizing time 150 min and 180 min respectively. The system has characteristics of convenient manipulation, non-destructive and high-resolution in-situ measurement. And the surface morphology, pore-ratio and effective refractive index can also be gained at the same time.

Electrical Responses of Modified Mineral Surfaces as Observed With Spectral Induced Polarization and Atomic Force Microscopy

The Dissociated Amorphous Silica Surface: Model Development and Evaluation.

Electrochemical Strain Microscopy of Silica Glasses

Probing Surface Charge Potentials of Clay Basal Planes and Edges by Direct Force Measurements

Study of In-Situ Measurement System for Porous Alumina Film Based on AFM and Reflectometric Interference Spectroscopy

Using Reflectometric Interference Spectroscopy To Real-Time Monitor Amphiphile-Induced Orientational Responses Of Liquid-Crystal-Loaded Silica Colloidal Crystal Films

Probing the Surface Electrical Properties of Clay Minerals with Electrostatic Force Microscopy and Kelvin Probe Force Microscopy

Investigations of mechanism of Ca2+ adsorption on silica and alumina based on Ca-ISE monitoring, potentiometric titration, electrokinetic measurements and surface complexation modeling

Surface Forces Apparatus Measurements of Interactions between Rough and Reactive Calcite Surfaces

Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

Complex conductivity of water-saturated packs of glass beads

On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials

On the relationship between induced polarization and surface area in metal-sand and clay-sand mixtures

X-ray microanalysis in STEM of short-term physico-chemical reactions at bioactive glass particles / biological fluids interface. Determination of O/Si atomic ratios

Analytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces: Implications for Kelvin Probe Force Microscopy

Dynamic electric force microscopy observation of polarization of CdS nanocrystals and carbon nanotubes on silicon substrates

Structure of the Silica/Divalent Electrolyte Interface: Molecular Insight into Charge Inversion with Increasing pH

Interaction Forces Between Muscovite and Silica Surfaces in Electrolyte Solutions Measured with Afm

Probing the Interaction Mechanism of Sodium Oleate and Dodecyl Amine with Quartz Surfaces in the Presence of Ca 2+ Ions by AFM Force Measurement

Quantifying Specific Ion Effects on the Surface Potential and Charge Density at Silica Nanoparticle–Aqueous Electrolyte Interfaces

Submicrometer-scale spatial heterogeneity in silicate glasses using aberration-corrected scanning transmission electron microscopy