Papillary oncocytoma of the eyelid. A previously undescribed tumor of apocrine gland origin.

I. R. Rodgers,F. Jakobiec,W. Krebs,A. Hornblass,M. P. Gingold

DOI: https://doi.org/10.1016/s0161-6420(88)33068-x

1988-08-01

Abstract:

What problem does this paper attempt to address?

Transient X‐Ray Absorption Near Edge Structure Spectroscopy Using Broadband Free‐Electron Laser Pulses

Pavle Juranić,Claudio Cirelli,Talgat Mamyrbayev,Yohei Uemura,Joan Vila‐Comamala,Frederico Alves Lima,Camila Bacellar,Philip J. M. Johnson,Eduard Prat,Sven Reiche,Anna Wach,Iuliia Bykova,Victoria Kabanova,Christopher Milne,Christian David

DOI: https://doi.org/10.1002/smtd.202301328

IF: 12.4

2024-03-07

Small Methods

Abstract:A beam‐splitting grating configuration that allows simultaneous measurements of the spectra of the incoming XFEL pulses and transmission XANES, which is crucial for compensating the pulse‐dependent intensity and spectrum fluctuations due to the self‐amplified spontaneous emission (SASE) operation. The implementation of this new methodology is applied on a liquid solution of ammonium iron(III) oxalate jet. A new method for time‐resolved X‐ray absorption near edge structure (XANES) spectroscopy that enables faster data acquisition and requires smaller sample quantities for high‐quality data, thus allowing the analysis of more samples in a shorter time is introduced. The method uses large bandwidth free electron laser pulses to measure laser‐excited XANES spectra in transmission mode. A beam‐splitting grating configuration allows simultaneous measurements of the spectra of the incoming X‐ray Free Electron Laser (XFEL) pulses and transmission XANES, which is crucial for compensating the pulse‐dependent intensity and spectrum fluctuations due to the self‐amplified spontaneous emission operation. The implementation of this new methodology is applied on a liquid solution of ammonium iron(III) oxalate jet and is compared to previous results, showing great improvements in the speed of acquisition and spectral resolution, and the ability to measure a large 2‐D spectral‐time map quickly.

materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
Experimental capabilities for liquid jet samples at sub-MHz rates at the FXE Instrument at European XFEL

F A Lima,F Otte,M Vakili,F Ardana-Lamas,M Biednov,F Dall'Antonia,P Frankenberger,W Gawelda,L Gelisio,H Han,X Huang,Y Jiang,M Kloos,T Kluyver,M Knoll,K Kubicek,I J Bermudez Macias,J Schulz,O Turkot,Y Uemura,J Valerio,H Wang,H Yousef,P Zalden,D Khakhulin,C Bressler,C Milne

DOI: https://doi.org/10.1107/S1600577523008159

2023-11-01

Abstract:The Femtosecond X-ray Experiments (FXE) instrument at the European X-ray Free-Electron Laser (EuXFEL) provides an optimized platform for investigations of ultrafast physical, chemical and biological processes. It operates in the energy range 4.7-20 keV accommodating flexible and versatile environments for a wide range of samples using diverse ultrafast X-ray spectroscopic, scattering and diffraction techniques. FXE is particularly suitable for experiments taking advantage of the sub-MHz repetition rates provided by the EuXFEL. In this paper a dedicated setup for studies on ultrafast biological and chemical dynamics in solution phase at sub-MHz rates at FXE is presented. Particular emphasis on the different liquid jet sample delivery options and their performance is given. Our portfolio of high-speed jets compatible with sub-MHz experiments includes cylindrical jets, gas dynamic virtual nozzles and flat jets. The capability to perform multi-color X-ray emission spectroscopy (XES) experiments is illustrated by a set of measurements using the dispersive X-ray spectrometer in von Hamos geometry. Static XES data collected using a multi-crystal scanning Johann-type spectrometer are also presented. A few examples of experimental results on ultrafast time-resolved X-ray emission spectroscopy and wide-angle X-ray scattering at sub-MHz pulse repetition rates are given.
Dental findings in chronic renal failure'

C. Renson

DOI: https://doi.org/10.1038/sj.bdj.4805806

1986-03-22

Abstract:
Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Steffen Staeck,Anna Andrle,Philipp Hönicke,Jonas Baumann,Daniel Grötzsch,Jan Weser,Gesa Goetzke,Adrian Jonas,Yves Kayser,Frank Förste,Ioanna Mantouvalou,Jens Viefhaus,Victor Soltwisch,Holger Stiel,Burkhard Beckhoff,Birgit Kanngießer

DOI: https://doi.org/10.3390/nano12213766

2022-10-26

Abstract:Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a Si3N4 lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory.
Resonant inelastic x-ray scattering in warm-dense Fe compounds beyond the SASE FEL resolution limit

Alessandro Forte,Thomas Gawne,Karim K. Alaa El-Din,Oliver S. Humphries,Thomas R. Preston,Céline Crépisson,Thomas Campbell,Pontus Svensson,Sam Azadi,Patrick Heighway,Yuanfeng Shi,David A. Chin,Ethan Smith,Carsten Baehtz,Victorien Bouffetier,Hauke Höppner,David McGonegle,Marion Harmand,Gilbert W. Collins,Justin S. Wark,Danae N. Polsin,Sam M. Vinko

2024-01-11

Abstract:Resonant inelastic x-ray scattering (RIXS) is a widely used spectroscopic technique, providing access to the electronic structure and dynamics of atoms, molecules, and solids. However, RIXS requires a narrow bandwidth x-ray probe to achieve high spectral resolution. The challenges in delivering an energetic monochromated beam from an x-ray free electron laser (XFEL) thus limit its use in few-shot experiments, including for the study of high energy density systems. Here we demonstrate that by correlating the measurements of the self-amplified spontaneous emission (SASE) spectrum of an XFEL with the RIXS signal, using a dynamic kernel deconvolution with a neural surrogate, we can achieve electronic structure resolutions substantially higher than those normally afforded by the bandwidth of the incoming x-ray beam. We further show how this technique allows us to discriminate between the valence structures of Fe and Fe$_2$O$_3$, and provides access to temperature measurements as well as M-shell binding energies estimates in warm-dense Fe compounds.

Materials Science,Plasma Physics
A sub‐100 nm thickness flat jet for extreme ultraviolet to soft X‐ray absorption spectroscopy

Dario De Angelis,Luca Longetti,Gabriele Bonano,Jacopo Stefano Pelli Cresi,Laura Foglia,Matteo Pancaldi,Flavio Capotondi,Emanuele Pedersoli,Filippo Bencivenga,Marija Krstulovic,Ralf Hendrik Menk,Sergio D'Addato,Stefano Orlando,Monica de Simone,Rebecca A. Ingle,Davide Bleiner,Marcello Coreno,Emiliano Principi,Majed Chergui,Claudio Masciovecchio,Riccardo Mincigrucci

DOI: https://doi.org/10.1107/s1600577524001875

IF: 2.557

2024-04-11

Journal of Synchrotron Radiation

Abstract:The commissioning of the liquid flat jet setup now available at the Elettra synchrotron and FERMI free‐electron laser is reported. The setup will allow the user to perform (time resolved‐)spectroscopy measurements in liquid environments in almost any open‐end beamline at Elettra and FERMI.Experimental characterization of the structural, electronic and dynamic properties of dilute systems in aqueous solvents, such as nanoparticles, molecules and proteins, are nowadays an open challenge. X‐ray absorption spectroscopy (XAS) is probably one of the most established approaches to this aim as it is element‐specific. However, typical dilute systems of interest are often composed of light elements that require extreme‐ultraviolet to soft X‐ray photons. In this spectral regime, water and other solvents are rather opaque, thus demanding radical reduction of the solvent volume and removal of the liquid to minimize background absorption. Here, we present an experimental endstation designed to operate a liquid flat jet of sub‐micrometre thickness in a vacuum environment compatible with extreme ultraviolet/soft XAS measurements in transmission geometry. The apparatus developed can be easily connected to synchrotron and free‐electron‐laser user‐facility beamlines dedicated to XAS experiments. The conditions for stable generation and control of the liquid flat jet are analyzed and discussed. Preliminary soft XAS measurements on some test solutions are shown.

optics,physics, applied,instruments & instrumentation
A compact single-shot soft X-ray photon spectrometer for free electron laser diagnostics

Kirk A. Larsen,Kurtis Borne,Razib Obaid,Andrei Kamalov,Yusong Liu,Xinxin Cheng,Justin James,Taran Driver,Kenan Li,Yanwei Liu,Anne Sakdinawat,Christian David,Thomas J. A. Wolf,James Cryan,Peter Walter,Ming-Fu Lin

2023-05-09

Abstract:The photon spectrum from free-electron laser (FEL) light sources offers valuable information in time-resolved experiments and machine optimization in the spectral and temporal domains. We have developed a compact single-shot photon spectrometer to diagnose soft X-ray spectra. The spectrometer consists of an array of off-axis Fresnel zone plates (FZP) that act as transmission-imaging gratings, a Ce-YAG scintillator, and a microscope objective to image the scintillation target onto a two-dimensional imaging detector. This spectrometer operates in an energy range which covers absorption edges associated with several atomic constituents carbon, nitrogen, oxygen, and neon. The spectrometer's performance is demonstrated at a repetition rate of 120 Hz, but our detection scheme can be easily extended to 200 kHz spectral collection by employing a fast complementary metal oxide semiconductor (CMOS) line-scan camera to detect the light from the scintillator. This compact photon spectrometer provides an opportunity for monitoring the spectrum downstream of an endstation in a limited space environment with subelectronvolt energy resolution.

Instrumentation and Detectors,Optics
Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources

Andrey Shavorskiy,Stefan Neppl,Daniel S Slaughter,James P Cryan,Katrin R Siefermann,Fabian Weise,Ming-Fu Lin,Camila Bacellar,Michael P Ziemkiewicz,Ioannis Zegkinoglou,Matthew W Fraund,Champak Khurmi,Marcus P Hertlein,Travis W Wright,Nils Huse,Robert W Schoenlein,Tolek Tyliszczak,Giacomo Coslovich,Joseph Robinson,Robert A Kaindl,Bruce S Rude,Andreas Ölsner,Sven Mähl,Hendrik Bluhm,Oliver Gessner,Daniel S. Slaughter,James P. Cryan,Katrin R. Siefermann,Michael P. Ziemkiewicz,Matthew W. Fraund,Marcus P. Hertlein,Travis W. Wright,Robert W. Schoenlein,Robert A. Kaindl,Bruce S. Rude

DOI: https://doi.org/10.1063/1.4894208

IF: 1.6

2014-09-01

Review of Scientific Instruments

Abstract:An apparatus for sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy studies with pulsed and constant wave X-ray light sources is presented. A differentially pumped hemispherical electron analyzer is equipped with a delay-line detector that simultaneously records the position and arrival time of every single electron at the exit aperture of the hemisphere with ~0.1 mm spatial resolution and ~150 ps temporal accuracy. The kinetic energies of the photoelectrons are encoded in the hit positions along the dispersive axis of the two-dimensional detector. Pump-probe time-delays are provided by the electron arrival times relative to the pump pulse timing. An average time-resolution of (780 ± 20) ps (FWHM) is demonstrated for a hemisphere pass energy E(p) = 150 eV and an electron kinetic energy range KE = 503-508 eV. The time-resolution of the setup is limited by the electron time-of-flight (TOF) spread related to the electron trajectory distribution within the analyzer hemisphere and within the electrostatic lens system that images the interaction volume onto the hemisphere entrance slit. The TOF spread for electrons with KE = 430 eV varies between ~9 ns at a pass energy of 50 eV and ~1 ns at pass energies between 200 eV and 400 eV. The correlation between the retarding ratio and the TOF spread is evaluated by means of both analytical descriptions of the electron trajectories within the analyzer hemisphere and computer simulations of the entire trajectories including the electrostatic lens system. In agreement with previous studies, we find that the by far dominant contribution to the TOF spread is acquired within the hemisphere. However, both experiment and computer simulations show that the lens system indirectly affects the time resolution of the setup to a significant extent by inducing a strong dependence of the angular spread of electron trajectories entering the hemisphere on the retarding ratio. The scaling of the angular spread with the retarding ratio can be well approximated by applying Liouville's theorem of constant emittance to the electron trajectories inside the lens system. The performance of the setup is demonstrated by characterizing the laser fluence-dependent transient surface photovoltage response of a laser-excited Si(100) sample.

instruments & instrumentation,physics, applied
3D-Printed Sheet Jet for Stable Megahertz Liquid Sample Delivery at X-ray Free Electron Lasers

Patrick E. Konold,Tong You,Johan Bielecki,Joana Valerio,Marco Kloos,Daniel Westphal,Alfredo Bellisario,Tej Varma,August Wolter,Jayanath C. P. Koliyadu,Faisal H.M. Koua,Romain Letrun,Adam Round,Tokushi Sato,Petra Mésźaros,Leonardo Monrroy,Jennifer Mutisya,Szabolcs Bódizs,Taru Larkiala,Amke Nimmrich,Roberto Alvarez,Richard Bean,Tomas Ekeberg,Richard A. Kirian,Sebastian Westenhoff,Filipe R. N. C. Maia

DOI: https://doi.org/10.1107/S2052252523007972

2023-06-13

Abstract:X-ray Free Electron Lasers (XFELs) can probe chemical and biological reactions as they unfold with unprecedented spatial and temporal resolution. A principal challenge in this pursuit is the delivery of samples to the X-ray interaction point in a way that produces data of the highest possible quality and efficiency. This is hampered by constraints posed by the light source and operation within a beamline environment. For liquid samples, the solution typically involves a high-speed liquid jet, capable of keeping up with the rate of X-ray pulses. However, conventional jets are not ideal because of radiation-induced explosions of the jet, as well as their cylindrical geometry combined with the X-ray pointing instability of many beamlines causes the interaction volume to differ for every pulse. This complicates data analysis and contributes to measurement errors. An alternative geometry is a liquid sheet jet which, with its constant thickness over large areas, eliminates the X-ray pointing related problems. Since liquid sheets can be made very thin, the radiation-induced explosion is reduced, boosting their stability. They are especially attractive for experiments which benefit from small interaction volumes such as fluctuation X-ray scattering and several types of spectroscopy. Although they have seen increasing use for soft X-ray applications in recent years, there has not yet been wide-scale adoption at XFELs. Here, we demonstrate liquid sheet jet sample injection at the European XFEL. We evaluate several aspects of its performance relative to a conventional liquid jet including thickness profile, stability, and radiation-induced explosion dynamics at high repetition rates. The sheet jet exhibits superior performance across these critical experimental parameters. Its minute thickness also suggests ultrafast single-particle solution scattering is a possibility.

Instrumentation and Detectors,Applied Physics,Biological Physics
The Liquid Jet Endstation for Hard X-ray Scattering and Spectroscopy at the Linac Coherent Light Source

Cali Antolini,Victor Sosa Alfaro,Marco Reinhard,Gourab Chatterjee,Ryan Ribson,Dimosthenis Sokaras,Leland Gee,Takahiro Sato,Patrick L Kramer,Sumana Laxmi Raj,Brandon Hayes,Pamela Schleissner,Angel T Garcia-Esparza,Jinkyu Lim,Jeffrey T Babicz Jr,Alec H Follmer,Silke Nelson,Matthieu Chollet,Roberto Alonso-Mori,Tim B van Driel

DOI: https://doi.org/10.3390/molecules29102323

IF: 4.6

2024-05-15

Molecules

Abstract:The ability to study chemical dynamics on ultrafast timescales has greatly advanced with the introduction of X-ray free electron lasers (XFELs) providing short pulses of intense X-rays tailored to probe atomic structure and electronic configuration. Fully exploiting the full potential of XFELs requires specialized experimental endstations along with the development of techniques and methods to successfully carry out experiments. The liquid jet endstation (LJE) at the Linac Coherent Light Source (LCLS) has been developed to study photochemistry and biochemistry in solution systems using a combination of X-ray solution scattering (XSS), X-ray absorption spectroscopy (XAS), and X-ray emission spectroscopy (XES). The pump-probe setup utilizes an optical laser to excite the sample, which is subsequently probed by a hard X-ray pulse to resolve structural and electronic dynamics at their intrinsic femtosecond timescales. The LJE ensures reliable sample delivery to the X-ray interaction point via various liquid jets, enabling rapid replenishment of thin samples with millimolar concentrations and low sample volumes at the 120 Hz repetition rate of the LCLS beam. This paper provides a detailed description of the LJE design and of the techniques it enables, with an emphasis on the diagnostics required for real-time monitoring of the liquid jet and on the spatiotemporal overlap methods used to optimize the signal. Additionally, various scientific examples are discussed, highlighting the versatility of the LJE.
In-situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

Michael Schneider,Christian M. Günther,Bastian Pfau,Flavio Capotondi,Michele Manfredda,Marco Zangrando,Nicola Mahne,Lorenzo Raimondi,Emanuele Pedersoli,Stefan Eisebitt

DOI: https://doi.org/10.1038/s41467-017-02567-0

2017-05-10

Abstract:Free-electron lasers (FEL) in the extreme ultraviolet (XUV) and X-ray regime opened up the possibility for experiments at high power densities, in particular allowing for fluence-dependent absorption and scattering experiments to reveal non-linear light-matter interactions at ever shorter wavelengths. Findings of such non-linear effects in the XUV and X-ray regime are met with tremendous interest, but prove difficult to understand and model due to the inherent shot-to-shot fluctuations in photon intensity and the often structured, non-Gaussian spatial intensity profile of a focused FEL beam. Presently, the focused beam spot is characterized and optimized separately from the actual experiment. Here, we present the first simultaneous measurement of diffraction signals from solid samples in tandem with the corresponding single-shot spatial fluence distribution on the actual sample. This new in-situ characterization scheme enables fast and direct monitoring and thus control of the sample illumination which ultimately is necessary for a quantitative understanding of non-linear light-matter interaction in X-ray and XUV FEL experiments.

Instrumentation and Detectors
Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Leora E. Dresselhaus-Marais,Bernard Kozioziemski,Theodor S. Holstad,Trygve Magnus Ræder,Matthew Seaberg,Daewoong Nam,Sangsoo Kim,Sean Breckling,Seonghyuk Choi,Matthieu Chollet,Philip K. Cook,Eric Folsom,Eric Galtier,Arnulfo Gonzalez,Tais Gorhover,Serge Guillet,Kristoffer Haldrup,Marylesa Howard,Kento Katagiri,Seonghan Kim,Sunam Kim,Sungwon Kim,Hyunjung Kim,Erik Bergback Knudsen,Stephan Kuschel,Hae-Ja Lee,Chuanlong Lin,R. Stewart McWilliams,Bob Nagler,Martin Meedom Nielsen,Norimasa Ozaki,Dayeeta Pal,Ricardo Pablo Pedro,Alison M. Saunders,Frank Schoofs,Toshimori Sekine,Hugh Simons,Tim van Driel,Bihan Wang,Wenge Yang,Can Yildirim,Henning Friis Poulsen,Jon H. Eggert

DOI: https://doi.org/10.1038/s41598-023-35526-5

2023-09-06

Abstract:The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

Materials Science
Effect of X-ray free-electron laser-induced shockwaves on haemoglobin microcrystals delivered in a liquid jet

Marie Luise Grünbein,Alexander Gorel,Lutz Foucar,Sergio Carbajo,William Colocho,Sasha Gilevich,Elisabeth Hartmann,Mario Hilpert,Mark Hunter,Marco Kloos,Jason E. Koglin,Thomas J. Lane,Jim Lewandowski,Alberto Lutman,Karol Nass,Gabriela Nass Kovacs,Christopher M. Roome,John Sheppard,Robert L. Shoeman,Miriam Stricker,Tim van Driel,Sharon Vetter,R. Bruce Doak,Sébastien Boutet,Andrew Aquila,Franz Josef Decker,Thomas R. M. Barends,Claudiu Andrei Stan,Ilme Schlichting

DOI: https://doi.org/10.1038/s41467-021-21819-8

IF: 16.6

2021-03-15

Nature Communications

Abstract:Abstract X-ray free-electron lasers (XFELs) enable obtaining novel insights in structural biology. The recently available MHz repetition rate XFELs allow full data sets to be collected in shorter time and can also decrease sample consumption. However, the microsecond spacing of MHz XFEL pulses raises new challenges, including possible sample damage induced by shock waves that are launched by preceding pulses in the sample-carrying jet. We explored this matter with an X-ray-pump/X-ray-probe experiment employing haemoglobin microcrystals transported via a liquid jet into the XFEL beam. Diffraction data were collected using a shock-wave-free single-pulse scheme as well as the dual-pulse pump-probe scheme. The latter, relative to the former, reveals significant degradation of crystal hit rate, diffraction resolution and data quality. Crystal structures extracted from the two data sets also differ. Since our pump-probe attributes were chosen to emulate EuXFEL operation at its 4.5 MHz maximum pulse rate, this prompts concern about such data collection.

multidisciplinary sciences
Resilient supply chain network design under competition: A case study

S. Rezapour,R. Farahani,M. Pourakbar

DOI: https://doi.org/10.1016/j.ejor.2016.11.041

IF: 6.4

2017-06-16

European Journal of Operational Research

Abstract:
Rapid decrease of phosphatidylinositol 4,5-bisphosphate in thrombin-stimulated platelets.

M. Billah,E. Lapetina

DOI: https://doi.org/10.1016/s0021-9258(18)33568-3

IF: 5.485

1982-11-10

Journal of Biological Chemistry

Abstract:
Extended X-ray absorption spectroscopy using an ultrashort pulse laboratory-scale laser-plasma accelerator

Brendan Kettle,Cary Colgan,Eva E. Los,Elias Gerstmayr,Matthew J. V. Streeter,Felicie Albert,Sam Astbury,Rory A. Baggott,Niall Cavanagh,Kateřina Falk,Timothy I. Hyde,Olle Lundh,P. Pattathil Rajeev,Dave Riley,Steven J. Rose,Gianluca Sarri,Chris Spindloe,Kristoffer Svendsen,Dan R. Symes,Michal Šmíd,Alec G. R. Thomas,Chris Thornton,Robbie Watt,Stuart P. D. Mangles

DOI: https://doi.org/10.1038/s42005-024-01735-1

2024-07-18

Communications Physics

Abstract:Laser-driven compact particle accelerators can provide ultrashort pulses of broadband X-rays, well suited for undertaking X-ray absorption spectroscopy measurements on a femtosecond timescale. Here the Extended X-ray Absorption Fine Structure (EXAFS) features of the K-edge of a copper sample have been observed over a 250 eV window in a single shot using a laser wakefield accelerator, providing information on both the electronic and ionic structure simultaneously. This capability will allow the investigation of ultrafast processes, and in particular, probing high-energy-density matter and physics far-from-equilibrium where the sample refresh rate is slow and shot number is limited. For example, states that replicate the tremendous pressures and temperatures of planetary bodies or the conditions inside nuclear fusion reactions. Using high-power lasers to pump these samples also has the advantage of being inherently synchronised to the laser-driven X-ray probe. A perspective on the additional strengths of a laboratory-based ultrafast X-ray absorption source is presented.

physics, multidisciplinary
Sensing the wavefront of x-ray free-electron lasers using aerosol spheres

N Duane Loh,Dmitri Starodub,Lukas Lomb,Christina Y Hampton,Andrew V Martin,Raymond G Sierra,Anton Barty,Andrew Aquila,Joachim Schulz,Jan Steinbrener,Robert L Shoeman,Stephan Kassemeyer,Christoph Bostedt,John Bozek,Sascha W Epp,Benjamin Erk,Robert Hartmann,Daniel Rolles,Artem Rudenko,Benedikt Rudek,Lutz Foucar,Nils Kimmel,Georg Weidenspointner,Guenter Hauser,Peter Holl,Emanuele Pedersoli,Mengning Liang,Mark S Hunter,Lars Gumprecht,Nicola Coppola,Cornelia Wunderer,Heinz Graafsma,Filipe R N C Maia,Tomas Ekeberg,Max Hantke,Holger Fleckenstein,Helmut Hirsemann,Karol Nass,Thomas A White,Herbert J Tobias,George R Farquar,W Henry Benner,Stefan Hau-Riege,Christian Reich,Andreas Hartmann,Heike Soltau,Stefano Marchesini,Sasa Bajt,Miriam Barthelmess,Lothar Strueder,Joachim Ullrich,Philip Bucksbaum,Matthias Frank,Ilme Schlichting,Henry N Chapman,Michael J Bogan

DOI: https://doi.org/10.1364/OE.21.012385

2013-05-20

Abstract:Characterizing intense, focused x-ray free electron laser (FEL) pulses is crucial for their use in diffractive imaging. We describe how the distribution of average phase tilts and intensities on hard x-ray pulses with peak intensities of 10(21) W/m(2) can be retrieved from an ensemble of diffraction patterns produced by 70 nm-radius polystyrene spheres, in a manner that mimics wavefront sensors. Besides showing that an adaptive geometric correction may be necessary for diffraction data from randomly injected sample sources, our paper demonstrates the possibility of collecting statistics on structured pulses using only the diffraction patterns they generate and highlights the imperative to study its impact on single-particle diffractive imaging.
Solution phase high repetition rate laser pump x-ray probe picosecond hard x-ray spectroscopy at the Stanford Synchrotron Radiation Lightsource

Marco Reinhard,Dean Skoien,Jacob A Spies,Angel T Garcia-Esparza,Benjamin D Matson,Jeff Corbett,Kai Tian,James Safranek,Eduardo Granados,Matthew Strader,Kelly J Gaffney,Roberto Alonso-Mori,Thomas Kroll,Dimosthenis Sokaras

DOI: https://doi.org/10.1063/4.0000207

2023-10-27

Abstract:We present a dedicated end-station for solution phase high repetition rate (MHz) picosecond hard x-ray spectroscopy at beamline 15-2 of the Stanford Synchrotron Radiation Lightsource. A high-power ultrafast ytterbium-doped fiber laser is used to photoexcite the samples at a repetition rate of 640 kHz, while the data acquisition operates at the 1.28 MHz repetition rate of the storage ring recording data in an alternating on-off mode. The time-resolved x-ray measurements are enabled via gating the x-ray detectors with the 20 mA/70 ps camshaft bunch of SPEAR3, a mode available during the routine operations of the Stanford Synchrotron Radiation Lightsource. As a benchmark study, aiming to demonstrate the advantageous capabilities of this end-station, we have conducted picosecond Fe K-edge x-ray absorption spectroscopy on aqueous [FeII(phen)3]2+, a prototypical spin crossover complex that undergoes light-induced excited spin state trapping forming an electronic excited state with a 0.6-0.7 ns lifetime. In addition, we report transient Fe Kβ main line and valence-to-core x-ray emission spectra, showing a unique detection sensitivity and an excellent agreement with model spectra and density functional theory calculations, respectively. Notably, the achieved signal-to-noise ratio, the overall performance, and the routine availability of the developed end-station have enabled a systematic time-resolved science program using the monochromatic beam at the Stanford Synchrotron Radiation Lightsource.
Transmission spectroscopy of CF$_4$ molecules in intense x-ray fields

Rui Jin,Adam Fouda,Alexander Magunia,Yeonsig Nam,Marc Rebholz,Alberto De Fanis,Kai Li,Gilles Doumy,Thomas M. Baumann,Michael Straub,Sergey Usenko,Yevheniy Ovcharenko,Tommaso Mazza,Jacobo Montaño,Marcus Agåker,Maria Novella Piancastelli,Marc Simon,Jan-Erik Rubensson,Michael Meyer,Linda Young,Christian Ott,Thomas Pfeifer

2024-07-05

Abstract:The nonlinear interaction of x-rays with matter is at the heart of understanding and controlling ultrafast molecular dynamics from an atom-specific viewpoint, providing new scientific and analytical opportunities to explore the structure and dynamics of small quantum systems. At increasingly high x-ray intensity, the sensitivity of ultrashort x-ray pulses to specific electronic states and emerging short-lived transient intermediates is of particular relevance for our understanding of fundamental multi-photon absorption processes. In this work, intense x-ray free-electron laser (XFEL) pulses at the European XFEL (EuXFEL) are combined with a gas cell and grating spectrometer for a high-intensity transmission spectroscopy study of multiphoton-induced ultrafast molecular fragmentation dynamics in CF$_4$. This approach unlocks the direct intra-pulse observation of transient fragments, including neutral atoms, by their characteristic absorption lines in the transmitted broad-band x-ray spectrum. The dynamics with and without initially producing fluorine K-shell holes are studied by tuning the central photon energy. The absorption spectra are measured at different FEL intensities to observe nonlinear effects. Transient isolated fluorine atoms and ions are spectroscopically recorded within the ultrashort pulse duration of few tens of femtoseconds. An isosbestic point that signifies the correlated transition between intact neutral CF$_4$ molecules and charged atomic fragments is observed near the fluorine K-edge. The dissociation dynamics and the multiphoton absorption-induced dynamics encoded in the spectra are theoretically interpreted. Overall, this study demonstrates the potential of high-intensity x-ray transmission spectroscopy to study ultrafast molecular dynamics with sensitivity to specific intermediate species and their electronic structure.

Atomic Physics,Chemical Physics,Optics
Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses

Kai Li,Joakim Laksman,Tommaso Mazza,Gilles Doumy,Dimitris Koulentianos,Alessandra Picchiotti,Svitozar Serkez,Nina Rohringer,Markus Ilchen,Michael Meyer,Linda Young

DOI: https://doi.org/10.1038/s42005-022-00962-8

2022-07-26

Communications Physics

Abstract:High-intensity ultrashort X-ray free-electron laser (XFEL) pulses are revolutionizing the study of fundamental nonlinear x-ray matter interactions and coupled electronic and nuclear dynamics. To fully exploit the potential of this powerful tool for advanced x-ray spectroscopies, a noninvasive spectral characterization of incident stochastic XFEL pulses with high resolution is a key requirement. Here we present a methodology that combines high-acceptance angle-resolved photoelectron time-of-flight spectroscopy and ghost imaging to enhance the quality of spectral characterization of x-ray free-electron laser pulses. Implementation of this noninvasive high-resolution x-ray diagnostic can greatly benefit the ultrafast x-ray spectroscopy community by functioning as a transparent beamsplitter for applications such as transient absorption spectroscopy in averaging mode as well as covariance-based x-ray nonlinear spectroscopies in single-shot mode where the shot-to-shot fluctuations inherent to a self-amplified spontaneous emission (SASE) XFEL pulse are a powerful asset.

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Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses