The Effect of Substrate Doping on the Behaviour of a CMOS Electrothermal Frequency-Locked-Loop

C. Zhang,K. Makinwa
DOI: https://doi.org/10.1109/SENSOR.2007.4300625
2007-06-10
Abstract:A CMOS electrothermal frequency-locked-loop (FLL) is presented, whose output frequency is determined by the temperature-dependent thermal diffusivity of the silicon substrate. Measurements show that this temperature dependence is essentially process independent. After a batch calibration, the electrothermal FLL has an untrimmed inaccuracy of less than plusmn0.7degC (3sigma) over the temperature range -40degC to 100degC.
What problem does this paper attempt to address?