A deconvolution method for estimating proton range from measured intensity distribution of prompt gamma rays

Tzu-Hsiang Lin,Hui-Yu Tsai,Ming-Wei Lin
DOI: https://doi.org/10.1016/j.radphyschem.2024.111617
IF: 2.776
2024-05-01
Radiation Physics and Chemistry
Abstract:This study developed a technique for proton range verification based on measuring the intensity distribution of prompt gamma rays (PGs) along the beam path in a target and applying a deconvolution method for retrieving the corresponding distribution of PG emissions. The end-of-range R r e t = d γ p + R r e s can be estimated according to the peak position d γ p of the retrieved PG emission and the residual range R r e s determined from the cross section of the relevant nuclear reaction. A 30-MeV, 1.5-nA proton beam irradiated polyethylene (PE) and polymethyl methacrylate (PMMA) targets, and spatial intensity distributions were obtained by measuring 4.4- and 6.13-MeV PGs from a depth of 0 mm to 10 mm; to this end, a collimator–detector arrangement comprising a 2-inch NaI(Tl) detector and a 2-mm-wide slit collimator was used. Simulations were conducted to identify the profile of PG emissions in a target and to determine the detector response; subsequently, the performance of the developed deconvolution algorithm was validated, and the limits of this approach were investigated. The data from the 30-MeV proton beam experiment were used, and the ranges R r e t were estimated to be 7.85 mm for the PE target and 7.07 mm for the PMMA target; these were considerably close to the range at 80% dose fall-off level R 80 achieved using Monte Carlo simulations. Our results demonstrated that a NaI(Tl)-based system with a millimeter-wide collimator can effectively resolve the spatial variation of PG emissions along a proton beam’s path. The proposed deconvolution method exhibited strong potential for verifying proton ranges with a sub-millimeter-level accuracy in a relatively simple and reliable manner.
chemistry, physical,physics, atomic, molecular & chemical,nuclear science & technology
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