Electrolyte/Dye/TiO 2 Interfacial Structures of Dye-Sensitized Solar Cells Revealed by In Situ Neutron Reflectometry with Contrast Matching
Ke Deng,Jacqueline M. Cole,Joshaniel F. K. Cooper,John R. P. Webster,Richard Haynes,Othman K. Al Bahri,Nina-Juliane Steinke,Shaoliang Guan,Liliana Stan,Xiaozhi Zhan,Tao Zhu,Daniel W. Nye,Gavin B. G. Stenning
DOI: https://doi.org/10.1021/acs.langmuir.0c03508
IF: 3.9
2021-01-25
Langmuir
Abstract:The nature of an interfacial structure buried within a device assembly is often critical to its function. For example, the dye/TiO<sub>2</sub> interfacial structure that comprises the working electrode of a dye-sensitized solar cell (DSC) governs its photovoltaic output. These structures have been determined outside of the DSC device, using <i>ex situ</i> characterization methods; yet, they really should be probed while held within a DSC since they are modulated by the device environment. Dye/TiO<sub>2</sub> structures will be particularly influenced by a layer of electrolyte ions that lies above the dye self-assembly. We show that electrolyte/dye/TiO<sub>2</sub> interfacial structures can be resolved using <i>in situ</i> neutron reflectometry with contrast matching. We find that electrolyte constituents ingress into the self-assembled monolayer of dye molecules that anchor onto TiO<sub>2</sub>. Some dye/TiO<sub>2</sub> anchoring configurations are modulated by the formation of electrolyte/dye intermolecular interactions. These electrolyte-influencing structural changes will affect dye-regeneration and electron-injection DSC operational processes. This underpins the importance of this <i>in situ</i> structural determination of electrolyte/dye/TiO<sub>2</sub> interfaces within representative DSC device environments.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acs.langmuir.0c03508?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acs.langmuir.0c03508</a>.Co-refinement of <i>ex situ</i> XR and NR data; determination of the relative extent of iodo species in the electrolyte layer atop the dye self-assembly; technical implementation of the background subtraction for the <i>in situ</i> NR data; errors in background subtraction for the <i>in situ</i> neutron reflectometry data; <i>in situ</i> neutron reflectometry measurement, and sample alignment geometries; determination of the thickness of the native SiO<sub>2</sub> layer on the silicon wafers; and dye/TiO<sub>2</sub> interfacial structures in the presence of acetonitrile and electrolyte components (<a class="ext-link" href="/doi/suppl/10.1021/acs.langmuir.0c03508/suppl_file/la0c03508_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
chemistry, multidisciplinary, physical,materials science