Mathematical Biology in Biology Direct

A. Yakovlev

DOI: https://doi.org/10.1186/1745-6150-3-1

2008-01-16

Biology Direct

Abstract:

What problem does this paper attempt to address?

Fitting X-ray diffraction peaks by a Genetic Algorithm and Monte Carlo Markov Chain procedure

David Durán González,F Sanchez Bajo

DOI: https://doi.org/10.1088/1402-4896/ad753d

2024-09-02

Physica Scripta

Abstract:A fitting procedure based on the use of the Genetic Algorithms (GA) and the Markov Chain Monte Carlo (MCMC) bayesian technique is proposed for the modelization of the X-ray diffraction peaks by using the usual standard bell-type functions (pseudo-Voigt, Voigt, etc). The method has been tested with simulated Voigt-shaped profiles at different overlapping degrees and the results have been compared with those obtained by means of the classical Levenberg-Marquardt algorithm, showing its reliability.

physics, multidisciplinary
Using the Genetic Algorithm to Determine the Parameters of X-Ray Diffractograms Through Different Functions

Duy Sang Nguyen,Tran Thi Kiem Thu

DOI: https://doi.org/10.1080/23324309.2024.2434020

IF: 0.348

2024-12-01

Journal of Computational and Theoretical Transport

Abstract:X-ray diffraction is an important technique used to determine crystallite size in materials science. However, determining the crystallite size accurately from X-ray diffraction data can be challenging due to the peak broadening and shape complexities. In this study, a genetic algorithm (GA) is employed to optimize the determination of crystallite size using X-ray diffraction data. The GA is used to fit a combination of Gaussian, Lorentzian, and Voigt functions to the X-ray diffraction data and determine the optimal crystal size. The optimized crystallite size is found to be consistent with other characterization techniques, demonstrating the validity of the proposed GA approach. Overall, this study presents a novel approach for the determination of crystallite size from X-ray diffraction data using GA optimization, which can be widely used in the field of materials science for accurate and efficient characterization of crystalline materials.

mathematics, applied,physics, mathematical
Automated Materials Spectroscopy Analysis using Genetic Algorithms

Miu Lun Lau,Min Long,Jeff Terry

DOI: https://doi.org/10.48550/arXiv.2203.10152

2022-03-19

Abstract:We introduce a Genetic Algorithm (GA) based, open-source project to solve multi-objective optimization problems of materials characterization data analysis including EXAFS, XPS and nanoindentation. The modular design and multiple crossover and mutation options make the software extensible for additional materials characterization applications too. This automation of the analysis is crucial in the era when instrumentation acquires data orders of magnitude more rapidly than it can be analyzed by hand. Our results demonstrated good fitness scores with minimal human intervention.

Neural and Evolutionary Computing,Computational Engineering, Finance, and Science
Hybrid approach to reconstruct nanoscale grating dimensions using scattering and fluorescence with soft X-rays

Leonhard M. Lohr,Richard Ciesielski,Vinh-Binh Truong,Victor Soltwisch

2024-10-31

Abstract:Scatterometry is a tested method for measuring periodic semiconductor structures. Since the sizes of modern semiconductor structures have reached the nanoscale regime, the challenge is to determine the shape of periodic nanostructures with sub-nanometer accuracy. To increase the resolution of scatterometry, short-wavelength radiation like soft X-rays can be used. But, scatterometry with soft X-rays is an inverse problem whose solutions can be ambiguous and its sensitivity should be further increased to determine the shape of even more complicated periodic nanostructures made up of different materials. To achieve unique solutions with smaller uncertainties, scatterometry can leverage the excitation of low-Z materials with soft X-rays. Additional information from soft X-ray fluorescence analysis in a hybrid measurement approach can mitigate the problem of ambiguous solutions from soft X-ray scattering and could further decrease uncertainty. In this work, the hybrid approach is utilized to perform a comparison of solutions from the inverse problem and determine the actual solution over ambiguous solutions.

Optics
Optimization of synchrotron radiation parameters using swarm intelligence and evolutionary algorithms

Adnan Sahin Karaca,Erkan Bostanci,Didem Ketenoglu,Manuel Harder,Ali Can Canbay,Bora Ketenoglu,Engin Eren,Ayhan Aydin,Zhong Yin,Mehmet Serdar Guzel,Michael Martins

DOI: https://doi.org/10.1107/s1600577524000717

IF: 2.557

2024-02-23

Journal of Synchrotron Radiation

Abstract:Different algorithms were tested on a synchrotron beamline. Results show that the swarm intelligence algorithm and the particle swarm optimization algorithm perform better than previous algorithms.Alignment of each optical element at a synchrotron beamline takes days, even weeks, for each experiment costing valuable beam time. Evolutionary algorithms (EAs), efficient heuristic search methods based on Darwinian evolution, can be utilized for multi‐objective optimization problems in different application areas. In this study, the flux and spot size of a synchrotron beam are optimized for two different experimental setups including optical elements such as lenses and mirrors. Calculations were carried out with the X‐ray Tracer beamline simulator using swarm intelligence (SI) algorithms and for comparison the same setups were optimized with EAs. The EAs and SI algorithms used in this study for two different experimental setups are the Genetic Algorithm (GA), Non‐dominated Sorting Genetic Algorithm II (NSGA‐II), Particle Swarm Optimization (PSO) and Artificial Bee Colony (ABC). While one of the algorithms optimizes the lens position, the other focuses on optimizing the focal distances of Kirkpatrick–Baez mirrors. First, mono‐objective evolutionary algorithms were used and the spot size or flux values checked separately. After comparison of mono‐objective algorithms, the multi‐objective evolutionary algorithm NSGA‐II was run for both objectives – minimum spot size and maximum flux. Every algorithm configuration was run several times for Monte Carlo simulations since these processes generate random solutions and the simulator also produces solutions that are stochastic. The results show that the PSO algorithm gives the best values over all setups.

optics,physics, applied,instruments & instrumentation
Obtaining 3D Atomic Reconstructions from Electron Microscopy Images Using a Bayesian Genetic Algorithm: Possibilities, Insights, and Limitations

Tom Stoops,Annick De Backer,Ivan Lobato,Sandra Van Aert

DOI: https://doi.org/10.1093/mam/ozae090

IF: 4.0991

2024-10-02

Microscopy and Microanalysis

Abstract:The Bayesian genetic algorithm (BGA) is a powerful tool to reconstruct the 3D structure of mono-atomic single-crystalline metallic nanoparticles imaged using annular dark field scanning transmission electron microscopy. The number of atoms in a projected atomic column in the image is used as input to obtain an accurate and atomically precise reconstruction of the nanoparticle, taking prior knowledge and the finite precision of atom counting into account. However, as the number of parameters required to describe a nanoparticle with atomic detail rises quickly with the size of the studied particle, the computational costs of the BGA rise to prohibitively expensive levels. In this study, we investigate these computational costs and propose methods and control parameters for efficient application of the algorithm to nanoparticles of at least up to 10 nm in size.

materials science, multidisciplinary,microscopy
Reproducible x-ray reflectometry optimization: statistical analysis of differential evolution fitting of multilayer structural models

Donald Windover,David Gil,Yasushi Azuma,Toshiyuki Fujimoto

DOI: https://doi.org/10.48550/arXiv.1410.8524

2014-10-31

Materials Science

Abstract:We test the reproducibility of X-ray reflectometry(XRR) measurements and optimizations using an National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and Technology (AIST) pre-standard. Based on bootstrap analysis of repeated refinements, using several CPU-years of time, we provide concrete recommendations of best practices for ensuring the reproducibility of XRR model fitting results. These recommendations can be used to study both instrument repeatability and cross-instrument reproducibility. Because the recommendations used optimizations methods available in commonly used commercial software, they can quickly be applied both in research and analytical laboratories, as well as fabrication environments.
Powder X-Ray Diffraction Assisted Evolutionary Algorithm for Crystal Structure Prediction

Stefano Racioppi,Alberto Otero De la Roza,Samad Hajinazar,Eva Zurek

2024-07-07

Abstract:Experimentally obtained X-ray diffraction (XRD) patterns can be difficult to solve, precluding the full characterization of materials, pharmaceuticals, and geological compounds. Herein, we propose a method based upon a multi-objective evolutionary search that uses both a structure's enthalpy and similarity to a reference XRD pattern (constituted by a list of peak positions and their intensities) to facilitate structure solution of inorganic systems. Because the similarity index is computed for locally optimized cells that are subsequently distorted to find the best match with the reference, this process transcends both computational (e.g. choice of theoretical method, and 0 K approximation) and experimental (e.g. external stimuli, and metastability) limitations. We illustrate how the proposed methodology can be employed to successfully uncover complex crystal structures by applying it to a range of test cases, including inorganic minerals, pure elements ramp-compressed to extreme conditions, and molecular crystals. The results demonstrate that our approach not only improves the accuracy of structure prediction but also significantly reduces the time required to achieve reliable solutions, thus providing a powerful tool for the advancement of materials science and related fields.

Materials Science
Advances in Kriging-Based Autonomous X-Ray Scattering Experiments

Marcus M. Noack,Gregory S. Doerk,Ruipeng Li,Masafumi Fukuto,Kevin G. Yager

DOI: https://doi.org/10.1038/s41598-020-57887-x

IF: 4.6

2020-01-28

Scientific Reports

Abstract:Abstract Autonomous experimentation is an emerging paradigm for scientific discovery, wherein measurement instruments are augmented with decision-making algorithms, allowing them to autonomously explore parameter spaces of interest. We have recently demonstrated a generalized approach to autonomous experimental control, based on generating a surrogate model to interpolate experimental data, and a corresponding uncertainty model, which are computed using a Gaussian process regression known as ordinary Kriging (OK). We demonstrated the successful application of this method to exploring materials science problems using x-ray scattering measurements at a synchrotron beamline. Here, we report several improvements to this methodology that overcome limitations of traditional Kriging methods. The variogram underlying OK is global and thus insensitive to local data variation. We augment the Kriging variance with model-based measures, for instance providing local sensitivity by including the gradient of the surrogate model. As with most statistical regression methods, OK minimizes the number of measurements required to achieve a particular model quality. However, in practice this may not be the most stringent experimental constraint; e.g. the goal may instead be to minimize experiment duration or material usage. We define an adaptive cost function, allowing the autonomous method to balance information gain against measured experimental cost. We provide synthetic and experimental demonstrations, validating that this improved algorithm yields more efficient autonomous data collection.

multidisciplinary sciences
Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine Learning

Anna Andrle,Philipp Hönicke,Grzegorz Gwalt,Philipp-Immanuel Schneider,Yves Kayser,Frank Siewert,Victor Soltwisch

DOI: https://doi.org/10.3390/nano11071647

IF: 5.3

2021-06-23

Nanomaterials

Abstract:The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next-generation integrated electronic circuits. Modern transistor architectures for, e.g., FinFETs are realized by lithographic fabrication of complex, well-ordered nanostructures. Recently, a novel characterization technique based on X-ray fluorescence measurements in grazing incidence geometry was proposed for such applications. This technique uses the X-ray standing wave field, arising from an interference between incident and the reflected radiation, as a nanoscale sensor for the dimensional and compositional parameters of the nanostructure. The element sensitivity of the X-ray fluorescence technique allows for a reconstruction of the spatial element distribution using a finite element method. Due to a high computational time, intelligent optimization methods employing machine learning algorithms are essential for timely provision of results. Here, a sampling of the probability distributions by Bayesian optimization is not only fast, but it also provides an initial estimate of the parameter uncertainties and sensitivities. The high sensitivity of the method requires a precise knowledge of the material parameters in the modeling of the dimensional shape provided that some physical properties of the material are known or determined beforehand. The unknown optical constants were extracted from an unstructured but otherwise identical layer system by means of soft X-ray reflectometry. The spatial distribution profiles of the different elements contained in the grating structure were compared to scanning electron and atomic force microscopy and the influence of carbon surface contamination on the modeling results were discussed. This novel approach enables the element sensitive and destruction-free characterization of nanostructures made of silicon nitride and silicon oxide with sub-nm resolution.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry
A genetic algorithm for the atomistic design and global optimisation of substitutionally disordered materials

Chris E. Mohn,Walter Kob

DOI: https://doi.org/10.1016/j.commatsci.2008.03.046

IF: 3.572

2009-03-01

Computational Materials Science

Abstract:We present a genetic algorithm for the atomistic design and global optimisation of substitutionally disordered bulk materials and surfaces. Premature convergence which hamper conventional genetic algorithms due to problems with synchronisation is avoided using a symmetry adapted crossover. The algorithm outperforms previously reported Monte Carlo and genetic algorithm simulations for finding low energy minima of two simple alloy models without the need for any redesign.

materials science, multidisciplinary
Small angle x-ray scattering metrology for sidewall angle and cross section of nanometer scale line gratings

Tengjiao Hu,Ronald L. Jones,Wen-li Wu,Eric K. Lin,Qinghuang Lin,Denis Keane,Steve Weigand,John Quintana

DOI: https://doi.org/10.1063/1.1773376

IF: 2.877

2004-08-15

Journal of Applied Physics

Abstract:High-volume fabrication of nanostructures requires nondestructive metrologies capable of measuring not only the pattern size but also the pattern shape profile. Measurement tool requirements will become more stringent as the feature size approaches 50nm and tolerances of pattern shape will reach a few nanometers. A small angle x-ray scattering (SAXS) based technique has been demonstrated to have the capability of characterizing the average pitch size and pattern width to subnanometer precision. In this study, we report a simple, modeling-free protocol to extract cross-section information such as the average sidewall angle and the pattern height of line grating patterns from the SAXS data. Diffraction peak intensities and reciprocal space positions are measured while the sample is rotated around the axis perpendicular to the grating direction. Linear extrapolations of peak positions in reciprocal space allow a precise determination of both the sidewall angle and the pattern height.

physics, applied
Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Yintao Song,Nobumichi Tamura,Chenbo Zhang,Mostafa Karami,Xian Chen

DOI: https://doi.org/10.1107/S2053273319012804

2019-09-14

Abstract:We propose a novel data-driven approach for analyzing synchrotron Laue X-ray microdiffraction scans based on machine learning algorithms. The basic architecture and major components of the method are formulated mathematically. We demonstrate it through typical examples including polycrystalline BaTiO$_3$, multiphase transforming alloys and finely twinned martensite. The computational pipeline is implemented for beamline 12.3.2 at the Advanced Light Source, Lawrence Berkeley National Lab. The conventional analytical pathway for X-ray diffraction scans is based on a slow pattern by pattern crystal indexing process. This work provides a new way for analyzing X-ray diffraction 2D patterns, independent of the indexing process, and motivates further studies of X-ray diffraction patterns from the machine learning prospective for the development of suitable feature extraction, clustering and labeling algorithms.

Materials Science,Data Analysis, Statistics and Probability
Robustness of "cut and splice" genetic algorithms in the structural optimization of atomic clusters

Vladimir A. Froltsov,Karsten Reuter

DOI: https://doi.org/10.1016/j.cplett.2009.04.015

2009-04-09

Abstract:We return to the geometry optimization problem of Lennard-Jones clusters to analyze the performance dependence of "cut and splice" genetic algorithms (GAs) on the employed population size. We generally find that admixing twinning mutation moves leads to an improved robustness of the algorithm efficiency with respect to this a priori unknown technical parameter. The resulting very stable performance of the corresponding mutation+mating GA implementation over a wide range of population sizes is an important feature when addressing unknown systems with computationally involved first-principles based GA sampling.

Materials Science
A Comparison of Genetic Algorithms and Simulated Annealing in Maximizing the Thermal Conductivity of Discrete Massive Chains

Alexander Kerr,Kieran Mullen

DOI: https://doi.org/10.48550/arXiv.1801.09328

2018-01-13

Abstract:Functions of chemical composition are complex and discrete in nature making it impossible to optimize them with gradient methods. Genetic algorithms, which do not use derivative information, are used to maximize the thermal conductivity of one-dimensional classical harmonic oscillators made from a fixed library of randomly generated molecular units. The ability for the genetic algorithm to build structures with components having no physical increment is important in optimizing molecules with a library of unrelated polymer units. The performance of genetic algorithms in this problem is compared with simulated annealing. Hyper-parameters for these routines are selected from a grid search in order to optimize their expected solution strength. The solutions found via the genetic algorithm consistently outperform those of simulated annealing at the cost of longer computer time. Together, these algorithms are able to find thermal conductor candidates that mirror solutions in continuous media.

Materials Science,Computational Physics
Systematic Comparison of Genetic Algorithm and Basin Hopping Approaches to the Global Optimization of Si(111) Surface Reconstructions

Maximilian N. Bauer,Matt I. J. Probert,Chiara Panosetti

DOI: https://doi.org/10.1021/acs.jpca.2c00647

2022-05-06

The Journal of Physical Chemistry A

Abstract:We present a systematic study of two widely used material structure prediction methods, the Genetic Algorithm and Basin Hopping approaches to global optimization, in a search for the 3 × 3, 5 × 5, and 7 × 7 reconstructions of the Si(111) surface. The Si(111) 7 × 7 reconstruction is the largest and most complex surface reconstruction known, and finding it is a very exacting test for global optimization methods. In this paper, we introduce a modification to previous Genetic Algorithm work on structure search for periodic systems, to allow the efficient search for surface reconstructions, and present a rigorous study of the effect of the different parameters of the algorithm. We also perform a detailed comparison with the recently improved Basin Hopping algorithm using Delocalized Internal Coordinates. Both algorithms succeeded in either resolving the 3 × 3, 5 × 5, and 7 × 7 DAS surface reconstructions or getting "sufficiently close", i.e., identifying structures that only differ for the positions of a few atoms as well as thermally accessible structures within kBT/unit area of the global minimum, with T = 300 K. Overall, the Genetic Algorithm is more robust with respect to parameter choice and in success rate, while the Basin Hopping method occasionally exhibits some advantages in speed of convergence. In line with previous studies, the results confirm that robustness, success, and speed of convergence of either approach are strongly influenced by how much the trial moves tend to preserve favorable bonding patterns once these appear.

chemistry, physical,physics, atomic, molecular & chemical
Machine learning for rapid inference of critical dimensions in optical metrology of nanopatterned surfaces

Ramin Sabbagh,Alec Stothert,Dragan Djurdjanovic

DOI: https://doi.org/10.1016/j.cirpj.2023.10.001

IF: 4.8

2023-10-22

CIRP Journal of Manufacturing Science and Technology

Abstract:Scatterometry-based metrology has the capability to perform high-throughput inspection of large-area nanopatterned surfaces. It utilizes physics-based dependencies between reflectance spectra of light scattered from nanopatterned surfaces and the geometric parameters, or so-called Critical Dimensions (CDs), of such nanopatterns. This paper proposes a novel method for rapid and accurate inference of CDs of complex nanopatterned surfaces through the use of a Machine Learning (ML)-based inverse problem mapping, coupled with the use of a strategic feature selection algorithm, which also originated from the ML domain. Specifically, Latin Hypercube Sampling was utilized to create a multi-dimensional grid of CDs which are used as inputs for physics-based simulations of scattered light spectra for nanopatterned surfaces with those CDs. Simulation results are used to build the training data for the ML model relating simulated reflectance spectra with the corresponding CDs. The Extreme Gradient Boosting (XGBoost) algorithm was utilized to realize the aforementioned mapping. In addition, most informative spectral wavelengths were selected using Recursive Feature Elimination (RFE) algorithm based on the feature importance scores obtained from XGBoost. Capabilities of the newly proposed approach were evaluated through inspection of a semiconductor wafer sample with hourglass patterns, which are characterized by eight CDs. It was observed that the proposed method is capable of real-time CD metrology of large-area nanostructured surfaces with complex nanopatterns, with accuracy and repeatability comparable to that of Scanning Electron Microscopy.

engineering, manufacturing
Towards scanning nanostructure X‐ray microscopy

Anton Kovyakh,Soham Banerjee,Chia-Hao Liu,Christopher J Wright,Yuguang C Li,Thomas E Mallouk,Robert Feidenhans'l,Simon J L Billinge,Christopher J. Wright,Yuguang C. Li,Thomas E. Mallouk,Simon J. L. Billinge

DOI: https://doi.org/10.1107/s1600576723005927

IF: 4.868

2023-07-30

Journal of Applied Crystallography

Abstract:A semi‐automated workflow is described for rapid‐scanning powder X‐ray diffraction and pair distribution function experiments. The software infrastructure saves metadata and raw and analyzed files into a collection stored on the local hard drive for easier reuse.This article demonstrates spatial mapping of the local and nanoscale structure of thin film objects using spatially resolved pair distribution function (PDF) analysis of synchrotron X‐ray diffraction data. This is exemplified in a lab‐on‐chip combinatorial array of sample spots containing catalytically interesting nanoparticles deposited from liquid precursors using an ink‐jet liquid‐handling system. A software implementation is presented of the whole protocol, including an approach for automated data acquisition and analysis using the atomic PDF method. The protocol software can handle semi‐automated data reduction, normalization and modeling, with user‐defined recipes generating a comprehensive collection of metadata and analysis results. By slicing the collection using included functions, it is possible to build images of different contrast features chosen by the user, giving insights into different aspects of the local structure.

chemistry, multidisciplinary,crystallography
An Improved Real--Space Genetic Algorithm for Crystal Structure and Polymorph Prediction

N.L. Abraham,M.I.J. Probert

DOI: https://doi.org/10.1103/PhysRevB.77.134117

2008-05-10

Abstract:Existing Genetic Algorithms for crystal structure and polymorph prediction can suffer from stagnation during evolution, with a consequent loss of efficiency and accuracy. An improved Genetic Algorithm (GA) is introduced herein which penalizes similar structures and so enhances structural diversity in the population at each generation. This is shown to improve the quality of results found for the theoretical prediction of simple model crystal structures. In particular, this method is demonstrated to find three new zero--temperature phases of the Dzugutov potential that have not been previously reported.

Materials Science
Systematic Comparison of Monte Carlo Annealing and Covariance Matrix Adaptation for the Optimization of ReaxFF Parameters

Ganna Shchygol,Alexei Yakovlev,Tomáš Trnka,Adri C.T. van Duin,Toon Verstraelen

DOI: https://doi.org/10.26434/chemrxiv.6606668.v1

2018-06-19

Abstract:ReaxFF is a computationally efficient force field to simulate complex reactive dynamics in extended molecular models with diverse chemistries, if reliable force-field parameters are available for the chemistry of interest. If not, they must be calibrated by minimizing the error ReaxFF makes on a relevant training set. Because this optimization is far from trivial, many methods, in particular genetic algorithms (GAs), have been developed to search for the global optimum in parameter space. Recently, two alternative parameter calibration techniques were proposed, i.e.\ Monte-Carlo Force Field optimizer (MCFF) and Covariance Matrix Adaptation Evolutionary Strategy (CMA-ES), which have the potential to find good parameters at a relatively low computational cost. In this work, these two methods are tested, as implemented in ADF2018, using three ReaxFF training sets, which have previously been used to benchmark GAs. Even though MCFF and CMA-ES should not be considered as exhaustive global optimizers, they can find parameters that are comparable in quality to those obtained with GAs. We observe that CMA-ES leads to slightly better results and is less sensitive to the initial guess of the parameters. Concrete recipes are provided for obtaining similar results with new training sets.Besides optimization recipes, a successful ReaxFF parameterization requires the design of a good training set. At every trial set of parameters, ReaxFF is used to optimize molecular geometries in the training set. When the optimization of some geometries fails easily, it becomes increasingly difficult to find the optimal parameters. We have addressed this issue by fixing several bugs in the ReaxFF forces and by improving the robustness of the geometry optimization. These improvements cannot eliminate all geometry convergence issues and we recommend to avoid very flexible geometries in the training set.Both MCFF and CMA-ES are still liable to converge to sub- or near-optimal parameters, which we detected by repeating the calibration with different random seeds. The existence of distinct near-optimal parameter vectors is a general pattern throughout our study and provides opportunities to improve the training set or to detect overfitting artifacts.

Mathematical Biology in Biology Direct

Fitting X-ray diffraction peaks by a Genetic Algorithm and Monte Carlo Markov Chain procedure

Using the Genetic Algorithm to Determine the Parameters of X-Ray Diffractograms Through Different Functions

Automated Materials Spectroscopy Analysis using Genetic Algorithms

Hybrid approach to reconstruct nanoscale grating dimensions using scattering and fluorescence with soft X-rays

Optimization of synchrotron radiation parameters using swarm intelligence and evolutionary algorithms

Obtaining 3D Atomic Reconstructions from Electron Microscopy Images Using a Bayesian Genetic Algorithm: Possibilities, Insights, and Limitations

Reproducible x-ray reflectometry optimization: statistical analysis of differential evolution fitting of multilayer structural models

Powder X-Ray Diffraction Assisted Evolutionary Algorithm for Crystal Structure Prediction

Advances in Kriging-Based Autonomous X-Ray Scattering Experiments

Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine Learning

A genetic algorithm for the atomistic design and global optimisation of substitutionally disordered materials

Small angle x-ray scattering metrology for sidewall angle and cross section of nanometer scale line gratings

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Robustness of "cut and splice" genetic algorithms in the structural optimization of atomic clusters

A Comparison of Genetic Algorithms and Simulated Annealing in Maximizing the Thermal Conductivity of Discrete Massive Chains

Systematic Comparison of Genetic Algorithm and Basin Hopping Approaches to the Global Optimization of Si(111) Surface Reconstructions

Machine learning for rapid inference of critical dimensions in optical metrology of nanopatterned surfaces

Towards scanning nanostructure X‐ray microscopy

An Improved Real--Space Genetic Algorithm for Crystal Structure and Polymorph Prediction

Systematic Comparison of Monte Carlo Annealing and Covariance Matrix Adaptation for the Optimization of ReaxFF Parameters