Abstract:One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This 'quantum weirdness' could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or "quantum electron microscope". A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope.

Electron Beam Characterization via Quantum Coherent Optical Magnetometry

A method of bunch by bunch measurement at nanoseconds interval by using cavity beam position monitors

Quantitative measurement of orbital angular momentum in electron microscopy

Transport and Non-Invasive Position Detection of Electron Beams from Laser-Plasma Accelerators

Generation and Measurement of Sub-Micrometer Relativistic Electron Beams

Measuring the Orbital Angular Momentum of Electron Beams

Single-shot determination of spin-polarization for ultrarelativistic electron beams via nonlinear Compton scattering

Highly sensitive single-molecule detection in slow protein ion beams

Time-resolved Measurements of Sub-Optical-cycle Relativistic Electron Beams

Designs for a quantum electron microscope

Electron Polarimetry with Nonlinear Compton Scattering

Directly Extracting the Authentic Basis of Cylindrical Vector Beams by a Pump-Probe Technique in an Atomic Vapor

Demonstration of Single-Shot Picosecond Time-Resolved MeV Electron Imaging Using a Compact Permanent Magnet Quadrupole Based Lens

Direct magneto-optical compression of an effusive atomic beam for high-resolution focused ion beam application

Imaging Nanometer-Scale Beamlets Arrays Of Relativistic Electron Beams

High-Field Optical Cesium Magnetometer for Magnetic Resonance Imaging

Doppler-Enhanced Quantum Magnetometry with thermal Rydberg atoms

Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance

Towards atomic-resolution quantum measurements with coherently-shaped free electrons

Optomechanical probe of an axial-vector mediated interaction in the quantum regime.

Direct Measurement of Photon Recoil from a Levitated Nanoparticle