Two-terminal transport in biased lattices: transition from ballistic to diffusive current

Andrey R. Kolovsky

2024-11-20

Abstract:We analyze quantum transport of charged fermionic particles in the tight-binding lattice connecting two particle reservoirs (the leads). If the lead chemical potentials are different they create an electric field which tilts the lattice. We study the effect of this tilt on quantum transport in the presence of weak relaxation/decoherence processes in the lattice. It is shown that the Landauer ballistic transport regime for a weak tilt (small chemical potential difference) changes to the diffusive Esaki-Tsu transport regime for a strong tilt (large chemical potential difference), where the critical tilt for this crossover is determined by the condition that the Wannier-Stark localization length coincides with the lattice length.

Mesoscale and Nanoscale Physics,Quantum Physics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: **Analyze the transition process from ballistic transport to diffusive transport in a tilted lattice**. Specifically, the author studied the quantum transport properties in a tight - binding lattice connecting fermion particle reservoirs with different chemical potentials in the presence of weak relaxation/decoherence processes.

### Problem Background

1. **Contradiction between Classical Theory and Experiment**
- Zener [1] proposed that under the action of an electric field, electrons in a crystal should exhibit periodic oscillations (i.e., Bloch oscillations), rather than a directed current.
- What is observed in experiments is a directed current, which is attributed to the interaction between Bloch oscillations and inelastic scattering between electrons and phonons.

2. **Landauer Theory**
- The Landauer theory describes ballistic transport in an unbiased lattice, where the current is related to the transmission probability of the system and is applicable to an infinite lattice.

3. **Esaki - Tsu Equation**
- Esaki and Tsu [2] proposed a classical formula for describing the diffusive current:
\[
\bar{j}\sim\frac{F / \gamma}{1+(F / \gamma)^{2}}
\]
where \(F\) is the electric field strength and \(\gamma\) is the scattering rate.

### Core Problems of the Paper

- **Transition from Ballistic Transport to Diffusive Transport**
- When the lattice is tilted (caused by different chemical potentials), the system will transition from ballistic transport (small chemical potential difference) to diffusive transport (large chemical potential difference).
- The key is to determine the critical point of this transition, that is, the condition when the Wannier - Stark localization length is equal to the lattice length.

### Main Findings

1. **Case without Relaxation Process**
- For a finite lattice without a relaxation process, when the electric field is weak, the system exhibits ballistic transport; when the electric field is strong, the Wannier - Stark localization effect leads to current suppression.

2. **Influence of Introducing Relaxation Process**
- After introducing a weak relaxation process, the Wannier - Stark localization is destroyed, enabling the system to generate a non - zero steady - state current even in the strong - electric - field region.
- The expression for this diffusive current is:
\[
\bar{j}\sim\tilde{\gamma}LJ\left(\frac{\Delta\mu}{C}\right)^{- 2}
\]
where \(\tilde{\gamma}\) is the relaxation rate, \(L\) is the lattice length, \(J\) is the transition matrix element, \(\Delta\mu\) is the chemical potential difference, and \(C\) is the capacitance.

### Conclusion

- By introducing the relaxation process, the paper explains the transition from ballistic transport to diffusive transport and provides numerical simulation results to verify this theory.
- These results are instructive for understanding this transition in actual physical systems because weak relaxation processes inevitably exist in the laboratory environment.

### References
[1] C. Zener, Proc. Roy. Soc. Lond. A 145, 523 (1934).
[2] L. Esaki and R. Tsu, IBM J. Res. Develop., 14, 61 (1970).