What problem does this paper attempt to address?

The problem that this paper attempts to solve is: how to extract the logical error rate more accurately and efficiently from the simulated surface - code storage experiments. Specifically, the author proposes a new method to estimate the performance of the decoder in quantum error correction. ### Background and Problem Description In quantum computing, the surface code is an important encoding method for quantum error correction. In order to evaluate the accuracy of the surface - code decoder, benchmark tests are usually carried out by simulating storage experiments on a classical computer. The basic steps of such experiments include: 1. **Preparation**: Initialize a logical qubit to a certain state (for example, \( | \bar{0} \rangle \)). 2. **Running the Stabilization Period**: Execute \( n \) stabilization measurement cycles. 3. **Measurement**: Measure the qubit under the Z basis and adjust the result according to the correction information provided by the decoder. If the final measurement result matches the initial state, the experiment is successful; otherwise, it fails. The accuracy of the decoder is usually measured by the logical error rate \( f(d) \), where \( d \) is the number of measurement rounds. ### Shortcomings of Existing Methods Existing methods estimate the experimental failure probability \( f_n \) by repeating the storage experiment many times, and then fit a curve to extract the logical error rate \( f(d) \). The advantage of this method is that it can avoid directly counting logical bit flips and only needs to determine their parity. However, it requires a large number of repeated experiments and a large amount of computation. ### Advantages of the New Method The new method simplifies this process by scanning the decoding graph layer by layer and tracking all the encountered bit - flip edges. The specific steps are as follows: 1. **Initialization**: Create an empty bidirectional mapping `pairs` to track anyon pairs and initialize the logical bit - flip count \( l \). 2. **Layer - by - layer Scanning**: For each layer (that is, each measurement cycle), traverse all bit - flip edges and update `pairs`. 3. **Recording Logical Bit Flips**: When an anyon pair crosses the opposite boundary of the decoding graph, record a logical bit flip and remove the pair. 4. **End Condition**: After \( n \) measurement cycles, ensure that there are no remaining anyon pairs and output the logical bit - flip count \( l \). The advantages of the new method are: - **Simplifying the Experiment**: Only one storage experiment is required to estimate the logical error rate. - **Reducing the Computation Amount**: There is no need to repeat the experiment many times, reducing the overall computation amount. - **Improving the Precision**: By scanning layer by layer and accurately recording logical bit flips, the accuracy of the estimate is improved. ### Summary This paper proposes a new method to estimate the logical error rate of the surface - code decoder more efficiently and accurately, thus providing strong support for the development of quantum error - correction technology.

Benchmarking Accuracy in an Emulated Memory Experiment

Modeling and Benchmarking Computing-in-Memory for Design Space Exploration.

Mitigating RC-Delay Induced Accuracy Loss in Analog In-Memory Computing: A Non-Compromising Approach

Using Detector Likelihood for Benchmarking Quantum Error Correction

Enabling Effective Error Mitigation in Memory Chips That Use On-Die Error-Correcting Codes

An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories

Benchmarking quantum logic operations relative to thresholds for fault tolerance

Learning efficient erasure protocols for an underdamped memory

Examem: Low-Overhead Memory Instrumentation for Intelligent Memory Systems

Measuring error rates of mid-circuit measurements

VECBEE: A Versatile Efficiency-Accuracy Configurable Batch Error Estimation Method for Greedy Approximate Logic Synthesis

Emulating Hybrid Memory on NUMA Hardware

Memristor Based Mixed-Accuracy Computation-in-Memory System.

Density-matrix simulation of small surface codes under current and projected experimental noise

Randomized Benchmarking of Quantum Gates

Efficient Error-Correcting-Code Mechanism for High-Throughput Memristive Processing-in-Memory

Universal and operational benchmarking of quantum memories

SERSim: a Soft Error Rate Simulator and a Case Study for a 32-Bit OpenRisc 1200 Microprocessor

Deterministic Benchmarking of Quantum Gates

Verification of Embedded Memory Systems using Efficient Memory Modeling

Randomized Benchmarking Protocol for Dynamic Circuits