Abstract:Future laser-interferometric gravitational wave detectors (GWDs) will potentially employ test mass mirrors from crystalline silicon and a laser wavelength of $1550\,\rm{nm}$, which corresponds to a photon energy below the silicon bandgap. Silicon might also be an attractive high-refractive index material for the dielectric mirror coatings. Films of amorphous silicon (a-Si), however, have been found to be significantly more absorptive at $1550\,\rm{nm}$ than crystalline silicon (c-Si). Here, we investigate the optical absorption of a Si/SiO$_2$ dielectric coating produced with the ion plating technique. The ion plating technique is distinct from the standard state-of-the-art ion beam sputtering technique since it uses a higher processing temperature of about 250$^\circ$C, higher particle energies, and generally results in higher refractive indices of the deposited films. Our coating stack was fabricated for a reflectivity of $R=99.95\,\%$ for s-polarized light at $1550\,\rm{nm}$ and for an angle of incidence of 44$^\circ$. We used the photothermal self-phase modulation technique to measure the coating absorption in s-polarization and p-polarization. We obtained $\alpha^{\rm coat}_{s}=(1035 \pm 42)\,\rm{ppm}$ and $\alpha^{\rm coat}_{p}=(1428 \pm 97)\,\rm{ppm}$. These results correspond to an absorption coefficient which is lower than literature values for a-Si which vary from $100\,\rm{/cm}$ up to $2000\,\rm{/cm}$. It is, however, still orders of magnitude higher than expected for c-Si and thus still too high for GWD applications.

Birefringence in a Silicon Beamsplitter at 2um for Future Gravitational Wave Detectors

Effects of mirror birefringence and its fluctuations to laser interferometric gravitational wave detectors

Precision Mapping of a Silicon Test Mass Birefringence

Reference Wave Source Based on Silicon Nitride Waveguide in Point Diffraction Interferometer

Optical anisotropy and strain-induced birefringence in dislocation-free silicon single crystals

Characterisation of birefringence inhomogeneity of KAGRA sapphire mirrors from transmitted wavefront error measurements

Optical Absorption Measurement at 1550 nm on a Highly-Reflective Si/SiO$_2$ Coating Stack

Analysis and Design of Refractive Index Biosensors Based on Single Silicon Nanobeam Cavity

Birefringence compensated arrayed waveguide grating

Optical Anisotropy in Dislocation-Free Silicon Single Crystals

Measurements of transmitted electron beam extinction through si crystal membranes

Thermally induced depolarization in a silicon (c-Si) single crystal

Silicon Oxy-Nitride for the Low Refractive Index Layers in the Mirror Coatings of the Cryogenic Laser Interferometer Gravitational Waves Detector

Precision control of thermal transport in cryogenic single-crystal silicon devices

Mapping the Optical Absorption of a Substrate-Transferred Crystalline AlGaAs Coating at 1.5um

High-birefringence direct UV-written waveguides for heralded single-photon sources at telecommunication wavelengths

Thermal deformation of cryogenically cooled silicon crystals under intense X-ray beams: measurement and finite-element predictions of the surface shape

Constraining gravitational wave amplitude birefringence with GWTC-3

Towards a sub-kelvin cryogenic Fabry-Perot silicon cavity

Reflectometry Measurements of the Loss Tangent in Silicon at Millimeter Wavelengths