Deep learning assisted high resolution microscopy image processing for phase segmentation in functional composite materials

Ganesh Raghavendran,Bing Han,Fortune Adekogbe,Shuang Bai,Bingyu Lu,William Wu,Minghao Zhang,Ying Shirley Meng
2024-10-03
Abstract:In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep learning methodologies for image analysis has attracted considerable interest in recent years, with multiple investigations employing such techniques for image segmentation and analysis within the realm of battery research. However, the automated analysis of high-resolution microscopy images for detecting phases and components in composite materials is still an underexplored area. This work proposes a novel workflow for detecting components and phase segmentation from raw high resolution transmission electron microscopy (TEM) images using a trained U-Net segmentation model. The developed model can expedite the detection of components and phase segmentation, diminishing the temporal and cognitive demands associated with scrutinizing an extensive array of TEM images, thereby mitigating the potential for human errors. This approach presents a novel and efficient image analysis approach with broad applicability beyond the battery field and holds potential for application in other related domains characterized by phase and composition distribution, such as alloy production.
Computer Vision and Pattern Recognition
What problem does this paper attempt to address?
The paper aims to address the challenging issue of high-resolution microscope image processing, particularly phase segmentation in functional composite materials. Specifically, the paper proposes a new workflow that utilizes a trained U-Net segmentation model to detect components and perform phase segmentation from high-resolution transmission electron microscopy (TEM) images. ### Problems the Paper Attempts to Solve: 1. **Difficulty in High-Resolution Microscope Image Processing**: In the field of battery research, processing complex high-resolution microscope images is a challenging task that requires a priori understanding of the components in the images. 2. **Lack of Automated Analysis**: Although deep learning methods have been widely applied in image analysis in recent years, automated analysis of high-resolution microscope images, especially in detecting phases and components in composite materials, remains an underexplored area. 3. **Reducing Human Error**: By developing an efficient and automated image analysis method, the time and cognitive burden of manually processing large amounts of TEM images can be significantly reduced, along with the potential for human errors. ### Main Contributions: - Proposes a new workflow based on the U-Net model for detecting components and performing phase segmentation from raw high-resolution TEM images. - This method can accelerate the process of component detection and phase segmentation, reducing the time and effort required to analyze large amounts of TEM images, while also lowering errors due to cognitive fatigue. - The method is not only applicable to the field of battery research but also has broad application potential in other related fields, such as alloy production. ### Method Overview: - Utilizes FFT technology to generate feature patterns of high-resolution TEM images and detects these features through the U-Net model. - Compares the identified features with the ICDD database to determine the components present in the TEM images. - Generates inverse FFT (IFFT) images for each component and maps periodic components through threshold processing. - Performs high-intensity processing on a large number of TEM images and generates intensity distribution maps for each component to observe their evolution. Through this method, researchers can quickly and accurately analyze high-resolution TEM images, improving work efficiency and reducing human errors.