A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles

Arda Genc,Justin Marlowe,Anika Jalil,Libor Kovarik,Phillip Christopher

2024-10-02

Abstract:Accurate and efficient characterization of nanoparticles (NPs), particularly regarding particle size distribution, is essential for advancing our understanding of their structure-property relationships and facilitating their design for various applications. In this study, we introduce a novel two-stage artificial intelligence (AI)-driven workflow for NP analysis that leverages prompt engineering techniques from state-of-the-art single-stage object detection and large-scale vision transformer (ViT) architectures. This methodology was applied to transmission electron microscopy (TEM) and scanning TEM (STEM) images of heterogeneous catalysts, enabling high-resolution, high-throughput analysis of particle size distributions for supported metal catalysts. The model's performance in detecting and segmenting NPs was validated across diverse heterogeneous catalyst systems, including various metals (Cu, Ru, Pt, and PtCo), supports (silica ($\text{SiO}_2$), $\gamma$-alumina ($\gamma$-$\text{Al}_2\text{O}_3$), and carbon black), and particle diameter size distributions with means and standard deviations of 2.9 $\pm$ 1.1 nm, 1.6 $\pm$ 0.2 nm, 9.7 $\pm$ 4.6 nm, and 4 $\pm$ 1.0 nm. Additionally, the proposed machine learning (ML) approach successfully detects and segments overlapping NPs anchored on non-uniform catalytic support materials, providing critical insights into their spatial arrangements and interactions. Our AI-assisted NP analysis workflow demonstrates robust generalization across diverse datasets and can be readily applied to similar NP segmentation tasks without requiring costly model retraining.

Materials Science,Artificial Intelligence

What problem does this paper attempt to address?

### What problems does this paper attempt to solve?

This paper aims to solve the problem of efficient and accurate characterization of nanoparticles (NPs), especially supported metal catalyst nanoparticles. Specifically, the researchers introduced a two - stage workflow based on artificial intelligence (AI) for high - throughput analysis of nanoparticle size distributions in transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) images. The following are the key problems that this paper attempts to solve:

1. **Accurate analysis of nanoparticle size distribution**:
- Accurate nanoparticle size distribution is crucial for understanding its structure - performance relationship, especially when designing and optimizing catalysts. Traditional methods such as chemisorption, dynamic light scattering (DLS), TEM, etc., have their own advantages and disadvantages, and have limitations when dealing with nanoparticles in complex backgrounds.

2. **Requirement for high - throughput and automated analysis**:
- Although TEM can provide high - resolution images, the traditional data collection and analysis processes lack automation, which limits its application in large - scale routine analysis. With the progress of 2D data analysis scale, there is an urgent need for reliable, reproducible and efficient high - throughput methods to analyze nanoparticle sizes.

3. **Segmentation and detection of nanoparticles in complex backgrounds**:
- Nanoparticles dispersed on catalytic materials usually show complex contrast and overlapping phenomena, which make it difficult for classical image processing methods (such as thresholding, edge detection, watershed segmentation) to handle effectively. These methods often fail when facing densely arranged, low - contrast and fine - scale nanoparticles, and require manual intervention to solve the problem of object and its boundary recognition.

4. **Improvement of model generalization ability**:
- Supervised and unsupervised machine learning algorithms face challenges in model generalization and compatibility. Existing convolutional neural networks (CNNs) such as U - Net usually require a large amount of labeled data for training, and perform poorly when dealing with images that are very different from the training set. Therefore, ensuring the stable performance of these models on different datasets is a key challenge.

To solve the above problems, the researchers developed a two - stage method that combines the YOLOv8x object detection model and Meta AI's Segment Anything Model (SAM). This method not only improves the accuracy of nanoparticle detection and segmentation, but also shows strong generalization ability and can be applied to similar tasks without retraining the model. In this way, this workflow significantly accelerates TEM particle analysis, enables efficient processing of thousands of nanoparticles, and promotes the automated analysis of large - scale datasets.