Look What You Made Me Glue: SEMGluTM Enabled Alternative Cryogenic Sample Preparation Process for Cryogenic Atom Probe Tomography Studies

Neil Mulcahy,James O Douglas,Michele Conroy

2024-08-07

Abstract:Extensive efforts over the past number of years have been applied to develop workflows for sample preparation of specimens for atom probe tomography at cryogenic temperatures. This is primarily due to the difficulty involved in preparing site specific lift out samples at cryogenic temperatures without the assistance of the gas injection system (GIS) as using it under cryogenic conditions leads to nonuniform and difficult to control deposition. Building on the efforts of previously developed GIS free workflows utilising redeposition techniques, this work provides an alternative approach using SEMGluTM, which is an electron beam curing adhesive that remains usable at cryogenic temperatures, to both lift out cryogenically frozen samples, and mount these samples to Si microarray posts for subsequent redeposition welding. This approach is applicable for a full cryogenic workflow but is particularly useful for non-fully cryogenic workflows such as beam sensitive samples, samples that mill easily, and samples with challenging geometries. We demonstrate atom probe analysis of silicon samples in both laser pulsing and voltage mode prepared using this workflow, with comparable analytical performance to a pre-sharpened microtip coupon. An application-based example which directly benefits from this approach, correlative Liquid Cell Transmission Electron Microscopy and cryogenic Atom Probe Tomography sample preparation, is also shown.

Materials Science,Instrumentation and Detectors

What problem does this paper attempt to address?

The paper aims to address the sample preparation issues in Cryogenic Atom Probe Tomography (APT). Specifically, the paper proposes a new method that utilizes SEMGluTM, an electron beam cured adhesive, for sample extraction and mounting at liquid nitrogen temperatures. This method overcomes the challenges of controlling deposition with the traditional Gas Injection System (GIS) under cryogenic conditions, thereby improving the success rate and reliability of sample preparation.

The paper demonstrates through experiments how to pre-prepare and coat the adhesive at room temperature, and then successfully extract silicon samples and mount them onto silicon microarray posts in a cryogenic environment. Additionally, it shows that this method can be effectively applied in the combined use of Liquid Cell Transmission Electron Microscopy (LCTEM) and cryogenic APT to study the dendrite growth mechanism, morphology, and composition in lithium-based battery systems. This process exhibits good reproducibility and applicability in practical applications.