Towards atom counting from first moment STEM images: methodology and possibilities

Yansong Hao,Annick De Backer,Scott David Findlay,Sandra Van Aert

2024-08-05

Abstract:Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares estimator to determine the unknown structure parameters of the images and to isolate contributions from individual atomic columns. In this way, a quantification of the projected potential per atomic column is achieved. Since the integrated projected potential of an atomic column scales linearly with the number of atoms it contains, it can serve as a basis for atom counting. The performance of atom counting from first moment STEM imaging is compared to that from traditional HAADF STEM in the presence of noise. Through this comparison, we demonstrate the advantage of first moment STEM images to attain more precise atom counts. Finally, we compare the integrated intensities extracted from first-moment images of a wedge-shaped sample to those values from the bulk crystal. The excellent agreement found between these values proves the robustness of using bulk crystal simulations as a reference library. This enables atom counting for samples with different shapes by comparison with these library values.

Materials Science,Applied Physics

What problem does this paper attempt to address?

The paper attempts to address the problem of achieving atomic counting in atomic resolution Scanning Transmission Electron Microscopy (STEM) images. Specifically, the researchers developed a quantification method based on a statistical model to determine unknown structural parameters from first moment STEM images and to separate the contributions of individual atomic columns. This method uses a uniformly weighted least squares estimator to calculate the projected potential of each atomic column and achieves atomic counting by comparing the projected potentials at different thicknesses. The paper also explores the performance of this method in the presence of noise and compares it with traditional High-Angle Annular Dark Field STEM (HAADF STEM) imaging, demonstrating the advantages of first moment STEM imaging in atomic counting.

The main contributions of the paper include:
1. **Development of a new quantification method**: This method can extract the projected potential of atomic columns from first moment STEM images, thereby achieving atomic counting.
2. **Improved accuracy of atomic counting**: Compared to traditional HAADF STEM, first moment STEM imaging shows higher accuracy in the presence of noise.
3. **Applicability to samples of different shapes**: By comparing the integrated intensity of wedge-shaped samples with the simulated values of bulk crystals, the robustness of the method in samples of different shapes is demonstrated.

These findings are of significant importance for the characterization of nanomaterials in materials science, especially in situations where precise understanding of the sample structure and chemical composition is required.