Abstract:Quantifying local structure is critical to understand and control material properties.While pair distribution function techniques from diffraction are commonly used to investigate the average local structure of a material, these approaches are limited by the lack of chemically and spatially resolved details.While electron microscopy exhibits superior spatial resolution, accurate determination of structure has been limited by imprecise knowledge of the illuminating and diffraction conditions (parallel beam) or sample drift (STEM).In contrast, the revolving STEM (RevSTEM) method introduces scan rotation between a series of fast-acquisition STEM images to encode the information about sample drift and leads to near distortion-free imaging after post-processing [1].In this talk, we will discuss how RevSTEM imaging can be made highly accurate and precise for local structure determination.Beyond drift, we will also show that the scan system axes are not orthonormal, resulting a 'global residual distortion' which must be calibrated to achieve accuracy [2].We will demonstrate and explain how to accurately and precisely remove this distortion.This is achieved using measurement of the projected-PDF (P-PDF) by locating and calculating the distance between all n th nearest neighbors (Figure 1a) [3].We will show how the standard deviation of each n th near neighbor distance can then be used to determine the coefficients of the calibration transformation matrix (Figure 1b):. Using well-calibrated RevSTEM imaging, we will then show how this approach opens new avenues to characterize local structure in complex oxide materials.Multiple case studies for complex oxides will be presented, including thin film and bulk materials [4].For example, we will show how picometer precise measurements enable the capability to directly observe static atomic displacements within a complex oxide solid solution exhibiting differences in local bonding (Figure 2a).We will also explore how local deviations from cubic symmetry can be observed in the oscillations of the standard deviations from the P-PDF (Figure 2b).Finally, we will discuss the application of application of spatial statistics, such as Bayesian classifiers, to explore the connection between local chemistry and structure [5].

Symmetry quantification and segmentation in STEM imaging through Zernike moments

Real-space tilting method for atomic resolution STEM imaging of nanocrystalline materials

Note: Symmetric Modulation Methodology Applied In Improving The Performance Of Scanning Tunneling Microscopy

Quantifying Local Structure of Complex Oxides Using Accurate and Precise Scanning Transmission Electron Microscopy

Atomic Spatial and Temporal Imaging of Local Structures and Light Elements Inside Zeolite Frameworks

Imaging and structure analysis of ferroelectric domains, domain walls, and vortices by scanning electron diffraction

Real‐Space Tilting Method for Atomic Resolution STEM Imaging of Nanocrystalline Materials

Multidimensional Images and Aberrations in STEM

Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Quantitative atomic cross section analysis by 4D-STEM and EELS

Segmentation of scanning tunneling microscopy images using variational methods and empirical wavelets

Decoding Material Structures with Scanning Electron Diffraction Techniques

Material structure, properties, and dynamics through scanning transmission electron microscopy

Objective Point Symmetry Classifications/Quantifications of an Electron Diffraction Spot Pattern with Pseudo-Hexagonal Metric

Seeing into Materials with Aberration-corrected STEM and First-Principles Theory

STEM SerialED: achieving high-resolution data for ab initio structure determination of beam-sensitive nanocrystalline materials

Three-dimensional structural and compositional inhomogeneity in zeolites unraveled by low-dose electron ptychography

The effect of scanning jitter on geometric phase analysis in STEM images.

Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy

Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns