Abstract:In analog circuits, process variation can cause unpredictability in circuit performance. Common-centroid (CC) type layouts have been shown to mitigate process-induced variations and are widely used to match circuit elements. Nevertheless, selecting the most suitable CC topology necessitates careful consideration of important layout constraints. Manual handling of these constraints becomes challenging, especially with large size problems. State-of-the-art CC placement methods lack an optimization framework to handle important layout constraints collectively. They also require manual efforts and consequently, the solutions can be suboptimal. To address this, we propose a unified framework based on multi-objective optimization for CC placement of analog transistors. Our method handles various constraints, including degree of dispersion, routing complexity, diffusion sharing, and layout dependent effects. The multi-objective optimization provides better handling of the objectives when compared to single-objective optimization. Moreover, compared to existing methods, our method explores more CC topologies. Post-layout simulation results show better performance compared to state-of-the-art techniques in generating CC layouts.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the unpredictability of circuit performance in analog circuits due to process variation during the manufacturing process. Specifically, the paper focuses on how to reduce the impact of these process variations on circuit performance by optimizing the Common - Centroid (CC) layout. The common - centroid layout is an effective technique for matching circuit elements and reducing the impact of random variations. However, choosing the most suitable CC topology requires careful consideration of important layout constraints, which becomes especially difficult in large - scale problems. Existing CC layout methods lack an optimization framework that can collectively handle important layout constraints and require manual effort, which may lead to sub - optimal solutions. To solve these problems, the authors propose a unified framework based on multi - objective optimization for CC layout of analog transistors. This method can handle various constraints, including dispersion, routing complexity, diffusion sharing, and layout - dependent effects. Compared with single - objective optimization, multi - objective optimization can better handle these objectives. In addition, compared with existing methods, this method can explore more CC topologies. Experimental results show that this method is superior to existing techniques in generating CC layouts. ### Main contributions: 1. **Proposed the first unified multi - objective optimization framework** for CC layout of analog transistors. 2. **Explored more CC topologies** by applying powerful transformation methods. 3. **The optimization formula covers important layout constraints**, including diffusion breaks, layout - dependent effects, routing costs, and dispersion. 4. **Post - layout simulation results show** that this method performs better than existing techniques under different circuit configurations and important constraints. ### Method overview: - **Initial layout**: Generate the initial layout by minimizing diffusion breaks. - **CC topology space exploration**: Use XX/180° and XY/180° transformations to explore more CC topologies. - **Enhanced AMOSA algorithm**: Improve the multi - objective optimization algorithm AMOSA to handle multiple new solutions in specific cases. ### Layout constraints: 1. **Dispersion**: Maximize the uniform distribution of devices throughout the array. 2. **Layout - Dependent Effects (LDE)**: Consider key layout - dependent effects such as well proximity effect (WPE). 3. **Routing cost**: Calculate the routing cost using the minimum - rectangle Steiner tree (MRST). ### Experimental results: - **Routing cost**: In multiple test cases, the routing cost is significantly reduced. - **Current mismatch**: In most test cases, the current mismatch value is improved. - **Layout area**: In some test cases, the layout area is reduced, reducing the use of virtual transistors. In conclusion, this paper effectively solves the optimization problem of CC layout in analog circuits by proposing a multi - objective optimization framework, improving circuit performance and reliability.

Multi-Objective Optimization for Common-Centroid Placement of Analog Transistors

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