Increased spatial coherence length from an asymmetric crystal reflection at grazing exit
Albert Macrander,Xianbo Shi,Walan Grizzoli,Xianrong Huang,Nino Pereira,Michael Wojcik,Lahsen Assoufid
DOI: https://doi.org/10.1107/s1600577524001425
IF: 2.557
2024-03-28
Journal of Synchrotron Radiation
Abstract:A multiple crystal diffraction arrangement with a final asymmetric crystal diffracting at grazing exit was found to yield a 76% longer spatial coherence length compared with that for a beam directly exiting a double‐crystal monochromator.Coherent X‐ray imaging is an active field at synchrotron sources. The images rely on the available coherent flux over a limited field of view. At many synchrotron beamlines a double‐crystal monochromator (DCM) is employed in a standard nondispersive arrangement. For coherent diffraction imaging it is advantageous to increase the available field of view by increasing the spatial coherence length (SCL) of a beam exiting such a DCM. Here, Talbot interferometry data together with ray‐tracing simulations for a (+ − − +) four‐reflection experimental arrangement are presented, wherein the first two reflections are in the DCM and the final fourth reflection is asymmetric at grazing exit. Analyses of the interferometry data combined with the simulations show that compared with the beam exiting the DCM a gain of 76% in the SCL was achieved, albeit with a factor of 20 reduction in flux density, which may not be a severe penalty at a synchrotron beamline. Previous efforts reported in the literature to increase the SCL that employed asymmetric crystal diffraction at grazing incidence are also discussed. A much reduced SCL is found presently in simulations wherein the same asymmetric crystal is set for grazing incidence instead of grazing exit. In addition, the present study is compared and contrasted with two other means of increasing the SCL. These are (i) focusing the beam onto an aperture to act as a secondary source, and (ii) allowing the beam to propagate in vacuum an additional distance along the beamline.
optics,physics, applied,instruments & instrumentation