Impact of reflection Comptonization on X-ray reflection spectroscopy: the case of EXO 1846-031

Songcheng Li,Honghui Liu,Cosimo Bambi,James F. Steiner,Zuobin Zhang

DOI: https://doi.org/10.1103/PhysRevD.110.043021

2024-08-13

Abstract:Within the disk-corona model, it is natural to expect that a fraction of reflection photons from the disk are Compton scattered by the hot corona (reflection Comptonization), even if this effect is usually ignored in X-ray reflection spectroscopy studies. We study the effect by using NICER and NuSTAR data of the Galactic black hole EXO 1846-031 in the hard-intermediate state with the model SIMPLCUTX. Our analysis suggests that a scattered fraction of order 10% is required to fit the data, but the inclusion of reflection Comptonization does not change appreciably the measurements of key-parameters like the black hole spin and the inclination angle of the disk.

High Energy Astrophysical Phenomena

What problem does this paper attempt to address?

The main problem that this paper attempts to solve is to explore the influence of reflection Comptonization on X - ray reflection spectroscopy. Specifically, the researchers used the observational data of the Galactic black hole EXO 1846 - 031 in the hard - intermediate state obtained by NICER and NuSTAR, and analyzed this effect through the model simplcutx. The research shows that in order to fit the data, a scattering fraction of about 10% is required, but including reflection Comptonization does not significantly change the measured values of key parameters (such as black hole spin and disk inclination).

### Research Background
In the accretion disk - corona model, a black hole accretes matter from a geometrically thin and optically thick accretion disk. The hot photons in the disk are then scattered by the hot electrons in the corona, producing a power - law component that irradiates the disk, thereby producing a reflection component with fluorescent emission lines and a Compton peak with a peak at 20 - 30 keV. High - quality data and correct astrophysical models make X - ray reflection spectroscopy a powerful tool for studying the morphology of accretion systems and the space - time around black holes.

### Research Methods
1. **Data Source**: Use the observational data of EXO 1846 - 031 by NICER and NuSTAR on August 3, 2019.
2. **Model Selection**:
- **Model 1**: Traditional modeling, using tbabs*(diskbb + nthcomp + relxillionCp nk).
- **Model 2**: Self - consistent modeling, using tbabs*simplcutx*(diskbb + relxillionCp nk), considering Compton scattering of reflected photons.
3. **Parameter Settings**: Including the temperature of the accretion disk, the index of the power - law component, the ionization parameter of the reflection component, etc.

### Main Findings
- **Influence of Reflection Comptonization**: Although a scattering fraction of about 10% is required to fit the data, reflection Comptonization has little influence on the measurement of key parameters (such as black hole spin and disk inclination).
- **Influence of Soft X - ray Data**: After adding the soft X - ray data of NICER, the fitting of the accretion disk component is more accurate, but the estimation of key parameters changes little.
- **Model Comparison**: Using the AICc criterion for model selection, the results show that model 2 is not statistically significantly better than model 1.

### Discussion
- **Physical Significance of Reflection Comptonization**: Although reflection Comptonization has little influence on key parameters, it may provide a useful internal consistency check in some cases, especially when the geometric structure and optical depth of the corona change.
- **Importance of Soft X - ray Data**: Soft X - ray data helps to fit the accretion disk component more accurately, but has a limited influence on the estimation of key parameters.

### Conclusion
This study explored the influence of reflection Comptonization on X - ray reflection spectroscopy by analyzing the observational data of NICER and NuSTAR. The results show that although reflection Comptonization has little influence on the measurement of key parameters, its role in specific cases is still worthy of further study. Meanwhile, the addition of soft X - ray data improves the fitting accuracy of the accretion disk component, but has a limited influence on the estimation of key parameters.