Next-Generation Time-Resolved Scanning Probe Microscopy

Katsuya Iwaya,Hiroyuki Mogi,Shoji Yoshida,Yusuke Arashida,Osamu Takeuchi,Hidemi Shigekawa
2024-03-27
Abstract:Understanding the nanoscale carrier dynamics induced by light excitation is the key to unlocking futuristic devices and innovative functionalities in advanced materials. Optical pump-probe scanning tunneling microscopy (OPP-STM) has opened a window to these phenomena. However, mastering the combination of ultrafast pulsed lasers with STM requires high expertise and effort. We have shattered this barrier and developed a compact OPP-STM system accessible to all. This system precisely controls laser pulse timing electrically and enables stable laser irradiation on sample surfaces. Furthermore, by applying this technique to atomic force microscopy (AFM), we have captured time-resolved force signals with an exceptionally high signal-to-noise ratio. Originating from the dipole-dipole interactions, these signals provide insights into the carrier dynamics on sample surfaces, which are activated by photo-illumination. These technologies are promising as powerful tools for exploring a wide range of photoinduced phenomena in conductive and insulating materials.
Materials Science,Applied Physics,Optics
What problem does this paper attempt to address?
The paper aims to address the issue of high spatial and temporal resolution detection of carrier dynamics in nanoscale materials. Specifically, the paper proposes an improved Optical Pump-Probe Scanning Tunneling Microscope (OPP-STM) system to overcome the time resolution limitations of traditional STM. By developing a compact and stable OPP-STM system, researchers are able to achieve precise measurements of the photoexcited carrier dynamic processes in nanoscale materials. Additionally, the paper introduces the extension of this technology to Atomic Force Microscopy (AFM) applications, thereby enabling research not only on conductive materials but also on insulating materials. This advancement is expected to promote a deeper understanding of various photo-induced phenomena and set new standards for nanoscale imaging technology.