Capacity of the Hebbian-Hopfield network associative memory

Mihailo Stojnic
2024-03-04
Abstract:In \cite{Hop82}, Hopfield introduced a \emph{Hebbian} learning rule based neural network model and suggested how it can efficiently operate as an associative memory. Studying random binary patterns, he also uncovered that, if a small fraction of errors is tolerated in the stored patterns retrieval, the capacity of the network (maximal number of memorized patterns, $m$) scales linearly with each pattern's size, $n$. Moreover, he famously predicted $\alpha_c=\lim_{n\rightarrow\infty}\frac{m}{n}\approx 0.14$. We study this very same scenario with two famous pattern's basins of attraction: \textbf{\emph{(i)}} The AGS one from \cite{AmiGutSom85}; and \textbf{\emph{(ii)}} The NLT one from \cite{Newman88,Louk94,Louk94a,Louk97,Tal98}. Relying on the \emph{fully lifted random duality theory} (fl RDT) from \cite{Stojnicflrdt23}, we obtain the following explicit capacity characterizations on the first level of lifting:
Machine Learning,Disordered Systems and Neural Networks,Information Theory,Probability
What problem does this paper attempt to address?