The quality assurance test of the SliT ASIC for the J-PARC muon $g-2$/EDM experiment

Takashi Yamanaka,Yoichi Fujita,Eitaro Hamada,Tetsuichi Kishishita,Tsutomu Mibe,Yutaro Sato,Yoshiaki Seino,Masayoshi Shoji,Taikain Suehara,Manobu M. Tanaka,Junji Tojo,Keisuke Umebayashi,Tamaki Yoshioka
2024-01-22
Abstract:The SliT ASIC is a readout chip for the silicon strip detector to be used at the J-PARC muon $g-2$/EDM experiment. The production version of SliT128D was designed and mass production was finished. A quality assurance test method for bare SliT128D chips was developed to provide a sufficient number of chips for the experiment. The quality assurance test of the SliT128D chips was performed and 5735 chips were inspected. No defect was observed in chips of 84.3%. Accepting a few channels with poor time walk performance out of 128 channels per chip, more than 90% yield can be achieved, which is sufficient to construct the whole detector.
Instrumentation and Detectors,High Energy Physics - Experiment
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