Testable Learning with Distribution Shift

Adam R. Klivans,Konstantinos Stavropoulos,Arsen Vasilyan
2024-05-21
Abstract:We revisit the fundamental problem of learning with distribution shift, in which a learner is given labeled samples from training distribution $D$, unlabeled samples from test distribution $D'$ and is asked to output a classifier with low test error. The standard approach in this setting is to bound the loss of a classifier in terms of some notion of distance between $D$ and $D'$. These distances, however, seem difficult to compute and do not lead to efficient algorithms.
Data Structures and Algorithms,Machine Learning
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