Abstract:The diffraction pattern of a material contains information not only on the crystal structures of its constituting phases, but also on its mesoscale spatial distributions of phases, grains, and ferroelastic, ferroelectric, and ferromagnetic domains. While diffraction patterns from experiments such as X-ray diffraction are presented in the reciprocal or Fourier space, mesoscale microstructure models such as the phasefield method naturally produce real-space images of spatial distribution of chemical composition, structural, and ferroic domains. Although one could rather readily compute the Fourier amplitudes of chemical and structural domain distributions generated by mesoscale simulations, they only contain information about the length scale and alignment of the real-space chemical and structure domains. Therefore, a direct comparison between diffraction experiments and mesoscale microstructure simulations is not possible. Here, we develop a theoretical approach to directly compute the crystal diffraction patterns of microstructures predicted by phase-field simulations. In particular, we consider five representative examples of microstructure patterns involving purely compositional domains, a single pair of tetragonal twin structures, multiple twin variants in a hexagonal system, ferroelectric polar vortices, and polycrystalline grains. The results are compared with previous experimental observations as well as X-ray diffraction experiments performed in the present study. The theoretical framework allows one to directly connect material microstructures and diffraction patterns predicted from phase-field simulations and the corresponding diffraction patterns from experiments, and thus providing guidance to experimental diffraction characterization and interpretation of microstructures.(c) 2022 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Imaging the Electric Field with X-Ray Diffraction Microscopy

Imaging and structure analysis of ferroelectric domains, domain walls, and vortices by scanning electron diffraction

High-Resolution Scanning X-ray Diffraction Microscopy

Imaging nonequilibrium atomic vibrations with x-ray diffuse scattering

Electronic properties of crystalline materials observed in X-ray diffraction

In situ Transmission Electron Microscopy Studies of Electric-field-induced Phenomena in Ferroelectrics

Diffraction contrast of ferroelectric domains in DPC STEM images

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Computing diffraction patterns of microstructures from phase-field simulations

Visualizing Three-Dimensional Micromechanical Response in Nanomaterials

Electric Field Driven Domain Wall Dynamics in BaTiO3 Nanoparticles

Imaging built-in electric fields and light matter by Fourier-precession TEM

Formalism to Image the Dynamics of Coherent and Incoherent Phonon with Dark-Field X-ray Microscopy using Kinematic Diffraction Theory

Time-Resolved X-Ray Scattering of an Electronically Excited State in Metal Complexes in Solution

X-ray Linear Dichroic Tomography of Crystallographic and Topological Defects

Application of laboratory micro X-ray fluorescence devices for X-ray topography

Revealing nano-scale lattice distortions in implanted material with 3D Bragg ptychography

Real-Space Visualization of Frequency-Dependent Anisotropy of Atomic Vibrations

Three-dimensional X-ray structural microscopy with submicrometre resolution

X-ray Free Electron Laser based Dark-Field X-ray Microscopy