Electron thermalization length in solid para-hydrogen at low-temperature

A. F. Borghesani,G. Carugno,G. Messineo,J. Pazzini
DOI: https://doi.org/10.1063/5.0163776
2023-07-29
Abstract:We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature \(T\approx 2.8\,\)K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive, slow negative charges as reported in all previous literature. We have found an average thermalization length \(\langle z_0\rangle\approx 260\,\)Å which is 3 to 5 times longer than that in liquid helium at the same temperature.
Chemical Physics
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