Abstract:With the advent of efficient brightness-preserving X-ray focusing optics and synchrotron radiation-based techniques,local crystal structure,orientation,microscopic elastic strain/stress,and defect type and density can all be probed with a single scan of micro-focused synchrotron polychromatic X-ray Laue diffraction (μXRD),and these microstructural features can be further related to the mechanical and physical properties of the crystals.The μXRD technique is particularly suitable for the non-destructive and quantitative mapping of the microstructural characteristics of inhomogeneous multiphase polycrystalline samples,as well as imperfect epitaxial crystals,without involving any critical sample preparation procedures.In this paper,three examples are introduced in details.First of all,the orientation distribution Nd2Ir2O7 polycrystals,which are brittle and virtually impossible for fine surface polishing,are mapped using the μXRD technique and related to their unique electrical conductance distribution.Secondly,the elastic lattice strain distribution in laser 3D printed Ni-based superalloy is studied and compared to the case in cast bulk materials.Finally,the defect type (mainly dislocations) and density are thoroughly mapped from the matrix to the cladding layers of a laser 3D printed Ni-based superalloy.By studying the nano-hardness of the same region using the technique of nano-indentation,the mechanical properties are successfully linked with the dislocation densities.As μXRD enters its 20th year of existence and new synchrotron nanodiffraction facilities are being built and commissioned around the world,two dimensional or even three dimensional scans on the testing specimens with tiny scanning steps become possible and giant amount of Laue diffraction data are collected.Therefore new data analysis algorithms and tools are being developed.In this paper we briefly review the new achievements and trends in this field.We take the opportunity to overview the current capabilities as well as the latest techinical developments,and hopefully can spur more and more Chinese researchers and scientists to take advantage of the powerful μXRD materials study technique.

The nanoscale imaging of the bulk polycrystalline material with the effects of depth of field and field of view based on x-ray free electron laser

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High-contrast Wide-Field Evanescent Wave Illuminated Subdiffraction Imaging.

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Far-field Nanoscale Thermal and Structure Imaging

X-Ray Phase Contrast and Fluorescence Nanotomography for Material Studies

Fluorescent Nanowire Ring Illumination for Wide-Field Far-Field Subdiffraction Imaging

Single-Pulse Enhanced Coherent Diffraction Imaging Of Bacteria With An X-Ray Free-Electron Laser

Nanoscale chemical imaging with structured X-ray illumination

Three-Dimensional Coherent Diffractive Imaging of Isolated Faceted Nanostructures

Synchrotron Polychromatic X-Ray Laue Microdiffraction Study on the Microstructures of Crystalline Materials

High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

Femtosecond mega-electron-volt electron microdiffraction

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

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Correlative Nanoscale 3D Imaging of Structure and Composition in Extended Objects

Three-dimensional X-ray structural microscopy with submicrometre resolution

Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization.

Revealing nano-scale lattice distortions in implanted material with 3D Bragg ptychography

Three-dimensional femtosecond snapshots of isolated faceted nanostructures

X-ray Free Electron Laser based Dark-Field X-ray Microscopy