Identification of Flaws from Scattered Ultrasonic Fields as Measured at a Planar Surface

L. Adler,K. Lewis,P. Szilas,D. Fitting
Abstract:Ultrasonic wave scattering from ellipsoidal and cylindrical cavities embedded in titanium was measured and analyzed with a newly designed signal processing system. Using an i mmersion system and samples with flat faces, the range for waves incident, at certain polar and azi•uthal angles,was dete~ined for both L-L and L-S scattering. Attempts were made to define key parameters from both amplltude and phase spectra for characterizing cavities. Results are compared to predictions of Bom approximations (developed by Krumhansl et al. at Cornell) and to experimental results taken by a contact system (Tittmann et al. at Rockwell ). A new (Keller type) theory for crack-li ke defects which includes mode conversion will also be presented.
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