Abstract:Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force Microscopy (PFM) is capable of detecting strains in these materials, down to the picometer range. Following the emergence of weaker materials, the smaller signals associated with them have revealed various crosstalk challenges that have limited the accuracy of measurements. Previous work demonstrated that the use of an interferometric displacement sensor (IDS) positioned appropriately above the tip of the cantilever (x/L~1), where x is the spot position and L is the cantilever length, has enabled sensitive and artifact-free electromechanical measurements. A similar approach has been employed in removing unwanted electrostatic and in-plane response contributions for the optical beam deflection (OBD) measurement technique commonly used in most atomic force microscopes. In the present study, extensive automated sub-resonance spot position dependent PFM measurements were conducted on periodically poled lithium niobate (PPLN). In this work, both IDS and OBD responses were measured simultaneously, allowing direct comparisons of the two approaches. The IDS showed a blind spot at x/L~1, as expected. However, for OBD measurements, the blind spot's location exhibited wider variation, ranging from 0.15<x/L<0.61. Furthermore, the magnitudes of the amplitudes measured with IDS and OBD were typically different, sometimes approaching disagreement by a factor of two. These measurements have important implications, not only for the PPLN measured here, but for more complex and unknown samples that have a heterogeneous polarization and electrical characteristic.

Toward accurate polarization estimation in nanoscopic systems

Quantification of polarization distribution from polarizing light microscopy images of ferroelectric single crystals

Nanoscale polarization manipulation and imaging in ferroelectric Langmuir-Blodgett polymer films

Sub-10 nm Probing of Ferroelectricity in Heterogeneous Materials by Machine Learning Enabled Contact Kelvin Probe Force Microscopy

Direct observation of room-temperature out-of-plane ferroelectricity and tunneling electroresistance at the two-dimensional limit

Direct Detection of Local Electric Polarization in the Interfacial Region in Ferroelectric Polymer Nanocomposites

Measurement of Nonlinear Current–Voltage Dependence of Interfacial Passive Layers for Ferroelectric Thin Films

Direct Observation of Nanoscale Dynamics of Ferroelectric Degradation

Defining ferroelectric characteristics with reversible piezoresponse: PUND switching spectroscopy PFM characterization

Nanoscale mapping of electric polarizability in a heterogeneous dielectric material with surface irregularities

The Characterization of Complex Polarization State in Ferroelectric Materials using Scanning Convergent Beam Electron Diffraction

Correlation Between Nanoscale and Nanosecond Resolved Ferroelectric Domain Dynamics and Local Mechanical Compliance

Polarization Switching in 2D Nanoscale Ferroelectrics: Computer Simulation and Experimental Data Analysis

Polarization Switching in Nanoscale Ferroelectrics

Berry Flux Diagonalization: Application to Electric Polarization

Quantitative Local Probing of Polarization with Application on HfO2‐Based Thin Films

Polarization-modulated rectification at ferroelectric surfaces

Nanoscale reversal of stable room temperature ferroelectric polarization in organic croconic acid thin films

Decoding Apparent Ferroelectricity in Perovskite Nanofibers.

Accurate Vertical Nanoelectromechanical Measurements

Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy