Determination of Major, Minor, and Trace Elements in Jadeite using Scanning micro-X-ray Fluorescence

E. Vicenzi,T. Lam

DOI: https://doi.org/10.1017/S1431927617005700

IF: 4.0991

2017-07-01

Microscopy and Microanalysis

Abstract:Jade is found as a lithic archaeological artifact with principal sources in Asia and Mesoamerica. One variety is comprised of jadeite (NaAlSi 2 O 6 ) and was valued by prehistoric artisans for both its visual and physical properties [1]. In this study, we have examined a bulk specimen from Japan (J1957) that has been cut, ground, and polished flat on one face [2]. A Bruker M4 Tornado scanning micro-XRF equipped with a Mo (collimated to 1 mm) and Rh (polycapillary tube with a 20 um spot at Mo K  ) x-ray sources, was operated at 50 kV for spectroscopic imaging. X-ray fluorescence was collected using two opposing 60 mm 2 silicon drift detectors (SDD). The irregularly shaped specimen was pressed into modeling clay with the aid of hand press, to maintain a near zero degree tilt of the polished face before being examined under vacuum. An overview of the compositional imaging and associated spectra of J1957 reveals that some trace elements can be imaged without significant interference arising from x-ray 1). Apart from increasing x-ray throughput, the dual detector geometry reduces the magnitude of such diffraction artifacts. Despite the thin architecture of the SDD, a few hundred  m in thickness, both Sn and Ba K lines were observed, above 25 and 32 keV respectively. Detection of peaks was owing to the diminished quantum efficiency of the SDD at these high energies coupled with their low concentration in

Chemistry,Geology,Materials Science