Abstract:MnBi2Te4 is an antiferromagnetic topological insulator that has stimulated intense interest due to its exotic quantum phenomena and promising device applications. The surface structure is a determinant factor to understand the magnetic and topological behavior of MnBi2Te4, yet its precise atomic structure remains elusive. Here we discovered a surface collapse and reconstruction of few-layer MnBi2Te4 exfoliated under delicate protection. Instead of the ideal septuple-layer structure in the bulk, the collapsed surface is shown to reconstruct as a Mn-doped Bi2Te3 quintuple layer and a MnxBiyTe double layer with a clear van der Waals gap in between. Combined with first-principles calculations, such surface collapse is attributed to the abundant intrinsic Mn–Bi antisite defects and the tellurium vacancy in the exfoliated surface, which is further supported by in situ annealing and electron irradiation experiments. Our results shed light on the understanding of the intricate surface-bulk correspondence of MnBi2Te4 and provide an insightful perspective on the surface-related quantum measurements in MnBi2Te4 few-layer devices.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsnano.0c03149?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsnano.0c03149</a>.Further experimental and theoretical details, including XPS chemical analysis and AFM characterizations of the MnBi2Te4 single crystal at the cleaved surface, more cross-sectional STEM images of the MnBi2Te4 surface and the corresponding EDS and EELS mapping, the statistical intensity variation in STEM images with different concentrations of exchange Mn–Bi defects, phonon dispersion of the MnTe DL structure, the formation energies of various defects in MnBi2Te4 under different chemical environments, relative surface energy with different defect concentrations, and DFT-calculated surface band structures of MnBi2Te4 SL and Bi2Te3 QL terminations (<a class="ext-link" href="/doi/suppl/10.1021/acsnano.0c03149/suppl_file/nn0c03149_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.

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