고장예지를 위한 온도사이클시험에서 칩저항 실장솔더의 고장메커니즘 연구

박노창,홍원식,한창운
2011-07-01
Abstract:A thermal cycle test was conducted on the chip resistor solder joint with a real-time failure monitoring. To detect the failure of the chip resistor solder joint during the test, the resistance between both ends of resistor is monitored until failure occurs. Monitored resistance was first observed to fluctuate linearly according to the temperature change. Initial aberration of the resistance occurred during the temperature decreasing time of the thermal cycle. More serious change of the resistance followed after some cycles at the temperature increasing time of the thermal cycle. To explain the failure patterns of solder joint, a mechanism for the solder failure was suggested and proved through FE simulations. Based on the explained failure mechanism, it was shown that a prognostics for the solder failure can be implemented by monitoring the resistance change in a thermal cycle condition.
Materials Science,Engineering
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