Automatic crystal identification for crystallography: a comparison between direct methods and artificial intelligence strategies

Camila F Lages,Vitoria Y Nicoleti,Maicon R Correa,Paulo Mausbach,Felipe C Ramos,Evandro A de Araujo,Andrey Z Nascimento,Eduardo X Miqueles
DOI: https://doi.org/10.1101/2024.08.22.609235
2024-09-05
Abstract:Crystallography is an important, and well-established technique for assessing crystalline atomic structure of a wide variety of materials. An auxiliary optical microscope instrument is used to perform the data acquisition at the Manaca beamline, a crystallography experimental station from Sirius (the 4th generation Brazilian synchrotron). The importance of detecting these crystals in the auxiliary image is to define the best order in which each crystal will be measured by the incident beam since each one of them must be measured only once; improving beamtime and maximizing user experience at the facility. Detecting rough crystal positions from these auxiliary images is a scientific computing task, which could benefit from some open artificial intelligence tools. This manuscript compares a real-time object detection interface (Yolo) with a new, simple and effective strategy obtained from a particular partial differential equation.
Bioinformatics
What problem does this paper attempt to address?
The paper aims to address the problem of automatically identifying crystal positions in crystal diffraction experiments. Specifically, the goal of the study is to quickly and accurately identify and extract the center of the crystal positions in microscope images, in order to perform efficient crystal measurements on synchrotron beamlines (such as Sirius in Brazil). Traditionally, this process requires researchers to manually select crystals, which is time-consuming and inefficient. Therefore, the paper proposes two methods to solve this problem: 1. **Partial Differential Equation (PDE) Method**: Enhancing the crystal edges by solving a specific diffusion equation, and then applying the Hough transform to detect the crystal centers. 2. **YOLO (You Only Look Once) Model**: Using a pre-trained YOLO model to directly detect crystals from the images. Both methods aim to improve the speed and accuracy of crystal identification, reduce manual operation time, and thereby enhance the efficiency and user experience of synchrotron beamlines.