A New Meshless Fragile Points Method (FPM) With Minimum Unknowns at Each Point, For Flexoelectric Analysis Under Two Theories with Crack Propagation. Part II: Validation and discussion

Yue Guan,Leiting Dong,Satya N. Atluri

DOI: https://doi.org/10.48550/arXiv.2011.06413

2020-09-28

Abstract:In the first part of this two-paper series, a new Fragile Points Method (FPM), in both primal and mixed formulations, is presented for analyzing flexoelectric effects in 2D dielectric materials. In the present paper, a number of numerical results are provided as validations, including linear and quadratic patch tests, flexoelectric effects in continuous domains, and analyses of stationary cracks in dielectric materials. A discussion of the influence of the electroelastic stress is also given, showing that Maxwell stress could be significant and thus the full flexoelectric theory is recommended to be employed for nano-scale structures. The present primal as well as mixed FPMs also show their suitability and effectiveness in simulating crack initiation and propagation with flexoelectric effect. Flexoelectricity, coupled with piezoelectric effect, can help, hinder, or deflect the crack propagation paths and should not be neglected in nano-scale crack analysis. In FPM, no remeshing or trial function enhancement are required in modeling crack propagation. A new Bonding-Energy-Rate(BER)-based crack criterion as well as classic stress-based criterion are used for crack development simulations. Other complex problems such as dynamic crack developments, fracture, fragmentation and 3D flexoelectric analyses will be given in our future studies.

Numerical Analysis

What problem does this paper attempt to address?

The problems that this paper attempts to solve mainly focus on the following points:

1. **Verify and discuss the effectiveness and accuracy of the Mesh - free Fracture Point Method (FPM) in analyzing the flexoelectric effect**:
- The second part of the paper provides several numerical results to verify the effectiveness of FPM in analyzing the flexoelectric effect. These verifications include linear and plane patch tests, the flexoelectric effect in continuous domains, and the analysis of stationary cracks in dielectric materials.

2. **Study the influence of electro - elastic stress**:
- By analyzing the flexoelectric effect under different theories, the paper shows that Maxwell stress can be very significant, especially in nanostructure. Therefore, it is recommended to use the complete flexoelectric theory to analyze these problems.

3. **Simulate the initiation and propagation of cracks**:
- FPM shows its applicability and effectiveness in simulating the initiation and propagation of cracks. The flexoelectric effect coupled with the piezoelectric effect can promote, hinder or deflect the crack propagation path, so the flexoelectric effect should not be ignored in the analysis of nanoscale cracks.

4. **Propose new crack criteria**:
- In FPM, there is no need to remesh or enhance the test function to model crack propagation. The paper introduces a crack criterion based on the Bonding - Energy - Rate (BER), as well as the classical stress - based criterion, for the simulation of crack development.

5. **Explore complex problems**:
- The paper also mentions that future research will involve more complex problems such as dynamic crack development, fracture, fragmentation, and three - dimensional flexoelectric analysis.

### Formula summary

- **Relative error formula**:
\[
e(x)=\frac{\|x_h - x\|_{L_2}}{\|x\|_{L_2}}, \quad \text{where} \quad \|x\|_{L_2}=\left(\int_{\Omega}x^T x \, d\Omega\right)^{1/2}
\]

- **Electromechanical coupling factor \(k_{\text{eff}}\)**:
\[
k_{\text{eff}}=\sqrt{\frac{\int_{\Omega}\varepsilon^T C \sigma \varepsilon \, d\Omega}{\int_{\Omega}E^T \Lambda E \, d\Omega}}
\]

- **Normalized piezoelectric constant \(e\)**:
\[
e = \frac{k_{\text{eff}}}{k_{\text{piezo}}}, \quad \text{where} \quad k_{\text{piezo}} \text{is} k_{\text{eff}} \text{without considering the flexoelectric effect}
\]

Through these studies, the paper aims to provide reliable numerical methods and theoretical support for the flexoelectric effect and its application in nanostructure.