Phonon Scattering Mechanism in Thermoelectric Materials Revised via Resonant X-ray Dynamical Diffraction

Adriana Valério,Rafaela F. S. Penacchio,Maurício B. Estradiote,Marli R. Cantarino,Fernando A. Garcia,Sérgio L. Morelhão,Niamh Rafter,Stefan W. Kycia,Guilherme A. Calligaris,Cláudio M. R. Remédios
DOI: https://doi.org/10.1557/mrc.2020.37
2020-06-23
Abstract:Engineering of thermoelectric materials requires an understanding of thermal conduction by lattice and electronic degrees of freedom. Filled skutterudites denote a large family of materials suitable for thermoelectric applications where reduced lattice thermal conduction attributed to localized low-frequency vibrations (rattling) of filler cations inside large cages of the structure. In this work, a multi-wavelength method of exploiting X-ray dynamical diffraction in single crystals of CeFe$_4$P$_{12}$ is presented and applied to resolve the atomic amplitudes of vibrations. The results suggest that the vibrational dynamics of the whole filler-cage system is the actual active mechanism behind the optimization of thermoelectric properties.
Materials Science
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