Precise measurement of the 7 Be electron capture decay half-life in Silicon Carbide

Claudio Santonastaso,Nicola Casali,Luigi Di Benedetto,Virginia Boldrini,Raffaele Buompane,M Canino,Vincenzo Carrano,Alba Formicola,Lucio Gialanella,Matthias Laubenstein,Henrich-Christoph Neitzert,Marco Pieruccini,Giuseppe Porzio,Alfredo Rubino
DOI: https://doi.org/10.1088/1361-6471/ad98ac
2024-11-30
Journal of Physics G Nuclear and Particle Physics
Abstract:In this work we present to our knowledge the most precise measurement of the 7 Be electron capture decay half-life. A SiC sample with 8.62·10 9 7 Be atoms was measured for 83.5 day on an ultra-low background high purity Ge detector located deep underground in the Laboratori Nazionali del Gran Sasso, Italy. The result obtained for the decay half-life is T 1/2 = 53.284 ± 0.016 days, which corresponds to an uncertainty of 0.3 ‰. Thanks to the high sensitivity achieved, this measurement is paving the way to further investigations on this process aiming to understand how environmental conditions may affect the decay half-life.
physics, particles & fields, nuclear
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