Robust transport of charge carriers in in-plane 1T′-2H MoTe2 homojunctions with ohmic contact
Donglin Lu,Zhenqing Li,Congsheng Xu,Siwei Luo,Chaoyu He,Jun Li,Gang Guo,Guolin Hao,Xiang Qi,Jianxin Zhong
DOI: https://doi.org/10.1007/s12274-020-3155-4
IF: 9.9
2021-01-05
Nano Research
Abstract:<p class="a-plus-plus">Metal-semiconductor ohmic contacts are required to reduce the energy dissipation for two-dimensional (2D) electronic devices, and phase engineering of 2D transition-metal dichalcogenides (TMDCs) is a promising approach for building ohmic contacts. Here, 2D in-plane 1T′-2H MoTe<sub class="a-plus-plus">2</sub> homojunctions were prepared by direct epitaxy via vapor deposition. The interface properties of in-plane 1T′-2H MoTe<sub class="a-plus-plus">2</sub> homojunction were investigated in detail by combining experiments, calculations and theories. The ohmic contact properties of 1T′-2H MoTe<sub class="a-plus-plus">2</sub> homojunction were proved according to Kelvin force probe microscopy and density functional theory calculations. The charge carriers robust transport in in-plane 1T′-2H MoTe<sub class="a-plus-plus">2</sub> homojunction without Fermi-level pinning can be well described by Poisson equation and band alignment. These results indicate that phase engineering of 2D TMDCs is promising to construct ohmic contacts for device applications.</p>
materials science, multidisciplinary,chemistry, physical,physics, applied,nanoscience & nanotechnology