ISCOPEM2D V1.0: An In‐Situ Method to Characterize and Compare CVD Graphene Films using Quality Matrix Approaches

Kishan Thodkar,Milivoj Plodinec,Fabian Gramm,Karsten Kunze
DOI: https://doi.org/10.1002/pssr.202300391
2024-01-29
physica status solidi (RRL) - Rapid Research Letters
Abstract:Single layer CVD graphene films are commonly transferred from their native growth substrates during characterization. However, the transfer process influences their intrinsic material properties and growth substrate‐related material information is lost. In this work, we present an in‐situ method to suspend CVD graphene films directly on their growth substrate. Our approach makes the sample compatible for characterization across the widely used optical and electron microscopy techniques such as Raman spectroscopy and transmission electron microscopy. In addition, we provide a quality matrix framework 'ISCOPEM2D V1.0' to support the quantification, comparison, and validation of various material properties of single layer graphene. Our approach provides a holistic overview of various properties and facilitates quality control and reproducibility of single layer graphene‐based application development. Similar approaches can be useful to develop quality matrix‐based for other two‐dimensional materials. This article is protected by copyright. All rights reserved.
physics, condensed matter, applied,materials science, multidisciplinary
What problem does this paper attempt to address?